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Artículo

The role of multiple electron capture in the x-ray emission process following charge exchange collisions with neutral targets

Otranto, SebastiánIcon ; Cariatore, Nelson DanielIcon ; Olson, R E
Fecha de publicación: 01/2015
Editorial: Institute of Physics
Revista: Journal of Physics: Conference Series
ISSN: 1742-6596
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Astronomía

Resumen

In this work we theoretically study photonic spectra that follow charge exchange processes between highly charged ions and neutral argon and CO targets. The range of collision energies studied is 5 eV/amu-10 keV/amu, covering typical EBIT-traps and Solar Wind energies. Our studies are based on multiple electrons schemes within the classical trajectory Monte Carlo method. Electrons are sorted with the sequential binding energies for the target under consideration. The role played by the multiple electron capture process for the different collision systems under consideration is explicitly analyzed and its contribution separated as arising from double radiative decay and autoionizing multiple capture. Present studies are stimulated by the upcoming launch of the Astro-H mission in 2015, which will provide high resolution spectra in the 0.3 keV-12keV band.
Palabras clave: Multiple Capture , Highly Charged Ions , Charge Exchange
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/48057
DOI: https://dx.doi.org/10.1088/1742-6596/583/1/012010
URL: http://iopscience.iop.org/article/10.1088/1742-6596/583/1/012010/meta
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Articulos(IFISUR)
Articulos de INSTITUTO DE FISICA DEL SUR
Citación
Otranto, Sebastián; Cariatore, Nelson Daniel; Olson, R E; The role of multiple electron capture in the x-ray emission process following charge exchange collisions with neutral targets; Institute of Physics; Journal of Physics: Conference Series; 583; 1-2015; 120101-120106
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