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dc.contributor.author
Lagubeau, Guillaume  
dc.contributor.author
Cobelli, Pablo Javier  
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Bobinski, Tomas  
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Maurel, Agnes  
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Pagneux, Vincent  
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Petitjeans, Philippe  
dc.date.available
2018-06-07T17:12:02Z  
dc.date.issued
2015-11  
dc.identifier.citation
Lagubeau, Guillaume; Cobelli, Pablo Javier; Bobinski, Tomas; Maurel, Agnes; Pagneux, Vincent; et al.; Empirical mode decomposition profilometry: small-scale capabilities and comparison to Fourier transform profilometry; Optical Society of America; Applied Optics; 54; 32; 11-2015; 9409-9414  
dc.identifier.issn
0003-6935  
dc.identifier.uri
http://hdl.handle.net/11336/47683  
dc.description.abstract
We present the empirical mode decomposition profilometry (EMDP) for the analysis of fringe projection profilometry (FPP) images. It is based on an iterative filter, using empirical mode decomposition, which is free of spatial filtering and adapted for surfaces characterized by a broadband spectrum of deformation. Its performances are compared to Fourier transform profilometry, the benchmark of FPP. We show both numerically and experimentally that using EMDP improves strongly the profilometry small-scale capabilities. Moreover, the height reconstruction distortion is much lower: the reconstructed height field is now both spectrally and statistically accurate. EMDP is thus particularly suited to quantitative experiments.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Optical Society of America  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights
Atribución-NoComercial-CompartirIgual 2.5 Argentina (CC BY-NC-SA 2.5 AR)  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Instrumentation  
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Measurement  
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Fringe Analysys  
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Phase Retrieval  
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Metrology  
dc.subject.classification
Astronomía  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Empirical mode decomposition profilometry: small-scale capabilities and comparison to Fourier transform profilometry  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-05-04T21:31:00Z  
dc.journal.volume
54  
dc.journal.number
32  
dc.journal.pagination
9409-9414  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Washington  
dc.description.fil
Fil: Lagubeau, Guillaume. Universidad de Santiago de Chile; Chile  
dc.description.fil
Fil: Cobelli, Pablo Javier. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina  
dc.description.fil
Fil: Bobinski, Tomas. Centre National de la Recherche Scientifique. Laboratoire Pmmh-umr 7636; Francia  
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Fil: Maurel, Agnes. Institut Langevin, Umr Cnrs; Francia  
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Fil: Pagneux, Vincent. Laboratoire D'acoustique, Univ. Maine Umr Cnrs 6613; Francia  
dc.description.fil
Fil: Petitjeans, Philippe. Centre National de la Recherche Scientifique. Laboratoire Pmmh-umr 7636; Francia  
dc.journal.title
Applied Optics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ads.osa.org/ao/abstract.cfm?uri=ao-54-32-9409  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1364/AO.54.009409