Artículo
Resistance and capacitance analysis of Pd-doped and undoped SnO2 thick films sensors exposed to CO atmospheres
Fecha de publicación:
25/07/2005
Editorial:
Elsevier
Revista:
Ceramics International
ISSN:
0272-8842
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
It was found that resistance and capacitance of Pd-doped SnO2 thick films are largely modified by CO reaction with previous adsorbed oxygen at the grain surface while in undoped SnO2 thick-films adsorption and reaction processes influence the response. In our analysis, the presence of Schottky potential barriers at the grain boundaries was consistent with the observed results. An increasing of sensitivity due to the addition of Pd is found to be related to the enhanced reaction of CO with the previous oxygen adsorbed at the grains surface. Mechanisms responsible for the sensor response are discussed.
Palabras clave:
A. FILMS
,
B. SURFACES
,
C. ELECTRICAL PROPERTIES
,
E. SENSORS
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Identificadores
Colecciones
Articulos(INTEMA)
Articulos de INST.DE INV.EN CIENCIA Y TECNOL.MATERIALES (I)
Articulos de INST.DE INV.EN CIENCIA Y TECNOL.MATERIALES (I)
Citación
Ponce, Miguel Adolfo; Castro, Miriam Susana; Aldao, Celso Manuel; Resistance and capacitance analysis of Pd-doped and undoped SnO2 thick films sensors exposed to CO atmospheres; Elsevier; Ceramics International; 32; 7; 25-7-2005; 733-737
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