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dc.contributor.author
Khanal, Shankar  
dc.contributor.author
Diaconu, Andrei  
dc.contributor.author
Vargas, Jose Marcelo  
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Lenormand, Denny R.  
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Garcia, Carlos  
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Ross, Caroline  
dc.contributor.author
Spinu, Leonard  
dc.date.available
2018-02-16T20:40:25Z  
dc.date.issued
2014-05-30  
dc.identifier.citation
Khanal, Shankar; Diaconu, Andrei; Vargas, Jose Marcelo; Lenormand, Denny R.; Garcia, Carlos; et al.; Exchange bias in (FeNi/IrMn)n multilayer films evaluated by static and dynamic techniques; IOP Publishing; Journal of Physics D: Applied Physics; 47; 25; 30-5-2014; 255002-255010  
dc.identifier.issn
0022-3727  
dc.identifier.uri
http://hdl.handle.net/11336/36680  
dc.description.abstract
Exchange bias properties of [FeNi/IrMn]n multilayer films with variable thickness of the ferromagnetic layers and different repetitions n were determined by using static and dynamic measurement techniques. The static magnetic properties were revealed through magnetometry measurements at room temperature following major hysteresis loops and first-order reversal curves protocols. Room temperature x-band ferromagnetic resonance (FMR) and vector network analyser (VNA)-FMR experiments were used to determine dynamically the exchange anisotropy in the FeNi/IrMn multilayers. From the static measurements the exchange anisotropy was determined while dynamic measurements allowed the determination of additional parameters including anisotropy field, saturation magnetization and rotatable anisotropy. The differences between the values of the exchange biased obtained from each technique are discussed. © 2014 IOP Publishing Ltd.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Magnetic Properties of Interfaces (Multilayers)  
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Fe And Its Alloys  
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Magnetic Anisotropy  
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Dynamic Properties  
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Static Properties  
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Astronomía  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Exchange bias in (FeNi/IrMn)n multilayer films evaluated by static and dynamic techniques  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-01-05T16:24:11Z  
dc.journal.volume
47  
dc.journal.number
25  
dc.journal.pagination
255002-255010  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Khanal, Shankar. University of New Orleans; Estados Unidos  
dc.description.fil
Fil: Diaconu, Andrei. University of New Orleans; Estados Unidos  
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Fil: Vargas, Jose Marcelo. University of New Orleans; Estados Unidos. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina  
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Fil: Lenormand, Denny R.. University of New Orleans; Estados Unidos  
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Fil: Garcia, Carlos. Universidad Técnica Federico Santa María; Chile  
dc.description.fil
Fil: Ross, Caroline. Massachusetts Institute of Technology; Estados Unidos  
dc.description.fil
Fil: Spinu, Leonard. University of New Orleans; Estados Unidos  
dc.journal.title
Journal of Physics D: Applied Physics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/0022-3727/47/25/255002  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/0022-3727/47/25/255002/meta