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dc.contributor.author
Wielgus, Maciek  
dc.contributor.author
Patorski, Krzysztof  
dc.contributor.author
Etchepareborda, Pablo Gonzalo  
dc.contributor.author
Federico, Roque Alejandro  
dc.date.available
2018-01-17T21:47:04Z  
dc.date.issued
2014-05  
dc.identifier.citation
Wielgus, Maciek; Etchepareborda, Pablo Gonzalo; Federico, Roque Alejandro; Patorski, Krzysztof; Continuous phase estimation from noisy fringe patterns based on the implicit smoothing splines; Optical Society of America; Optics Express; 22; 9; 5-2014; 10775-10791  
dc.identifier.issn
1094-4087  
dc.identifier.uri
http://hdl.handle.net/11336/33743  
dc.description.abstract
We introduce the algorithm for the direct phase estimation from the single noisy interferometric pattern. The method, named implicit smoothing spline (ISS), can be regarded as a formal generalization of the smoothing spline interpolation for the case when the interpolated data is given implicitly. We derive the necessary equations, discuss the properties of the method and address its application for the direct estimation of the continuous phase in both classical interferometry and digital speckle pattern interferometry (DSPI). The numerical illustrations of the algorithm performance are provided to corroborate the high quality of the results.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Optical Society of America  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by/2.5/ar/  
dc.subject
Análisis de Franjas  
dc.subject
Recuperación de Fase  
dc.subject
Interferometría de Speckle  
dc.subject
Metrología  
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Continuous phase estimation from noisy fringe patterns based on the implicit smoothing splines  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-01-16T18:23:24Z  
dc.journal.volume
22  
dc.journal.number
9  
dc.journal.pagination
10775-10791  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Washington, DC  
dc.description.fil
Fil: Wielgus, Maciek. Uniwersytet Warszawski; Argentina  
dc.description.fil
Fil: Patorski, Krzysztof. Uniwersytet Warszawski; Argentina  
dc.description.fil
Fil: Etchepareborda, Pablo Gonzalo. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
Optics Express  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/abstract.cfm?uri=oe-22-9-10775  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1364/OE.22.010775