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dc.contributor.author
Wielgus, Maciek
dc.contributor.author
Patorski, Krzysztof
dc.contributor.author
Etchepareborda, Pablo Gonzalo
dc.contributor.author
Federico, Roque Alejandro
dc.date.available
2018-01-17T21:47:04Z
dc.date.issued
2014-05
dc.identifier.citation
Wielgus, Maciek; Etchepareborda, Pablo Gonzalo; Federico, Roque Alejandro; Patorski, Krzysztof; Continuous phase estimation from noisy fringe patterns based on the implicit smoothing splines; Optical Society of America; Optics Express; 22; 9; 5-2014; 10775-10791
dc.identifier.issn
1094-4087
dc.identifier.uri
http://hdl.handle.net/11336/33743
dc.description.abstract
We introduce the algorithm for the direct phase estimation from the single noisy interferometric pattern. The method, named implicit smoothing spline (ISS), can be regarded as a formal generalization of the smoothing spline interpolation for the case when the interpolated data is given implicitly. We derive the necessary equations, discuss the properties of the method and address its application for the direct estimation of the continuous phase in both classical interferometry and digital speckle pattern interferometry (DSPI). The numerical illustrations of the algorithm performance are provided to corroborate the high quality of the results.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Optical Society of America
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by/2.5/ar/
dc.subject
Análisis de Franjas
dc.subject
Recuperación de Fase
dc.subject
Interferometría de Speckle
dc.subject
Metrología
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Continuous phase estimation from noisy fringe patterns based on the implicit smoothing splines
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-01-16T18:23:24Z
dc.journal.volume
22
dc.journal.number
9
dc.journal.pagination
10775-10791
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Washington, DC
dc.description.fil
Fil: Wielgus, Maciek. Uniwersytet Warszawski; Argentina
dc.description.fil
Fil: Patorski, Krzysztof. Uniwersytet Warszawski; Argentina
dc.description.fil
Fil: Etchepareborda, Pablo Gonzalo. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.journal.title
Optics Express
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/abstract.cfm?uri=oe-22-9-10775
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1364/OE.22.010775
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