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dc.contributor.author
Blasco, Juli
dc.contributor.author
Ghenzi, Néstor
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Suãé, Jordi
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Levy, Pablo Eduardo
dc.contributor.author
Miranda, Enrique
dc.date.available
2018-01-16T15:09:54Z
dc.date.issued
2014-01
dc.identifier.citation
Suãé, Jordi; Levy, Pablo Eduardo; Miranda, Enrique; Blasco, Juli; Ghenzi, Néstor; Modeling of the Hysteretic I-V Characteristics of TiO2-Based Resistive Switches Using the Generalized Diode Equation; Institute of Electrical and Electronics Engineers; IEEE Electron Device Letters; 35; 3; 1-2014; 390-392
dc.identifier.issn
0741-3106
dc.identifier.uri
http://hdl.handle.net/11336/33395
dc.description.abstract
An equivalent circuit representation for the conduction characteristics of TiO2-based resistive switches based on the generalized diode equation is reported. The proposed model consists of two antiparallel diodes with series and parallel resistances representing the filamentary current pathway spanning the oxide layer and the possible parasitic conduction effects. The model accounts for the pulse-induced hysteretic behavior exhibited by the I-V characteristic after electroforming. Three different approaches, each one of them with increased complexity, are assessed: 1) constant; 2) nanowire-like; and 3) sigmoidal diode amplitude. In all cases, the logarithmic conductance of the diodes is modeled using a logistic-type threshold function.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Modelling
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Diode
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Memristor
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Resistive Switching
dc.subject.classification
Astronomía
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Modeling of the Hysteretic I-V Characteristics of TiO2-Based Resistive Switches Using the Generalized Diode Equation
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-01-11T13:46:46Z
dc.identifier.eissn
1558-0563
dc.journal.volume
35
dc.journal.number
3
dc.journal.pagination
390-392
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Thousand Oak
dc.description.fil
Fil: Blasco, Juli. Universitat Autònoma de Barcelona; España
dc.description.fil
Fil: Ghenzi, Néstor. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Suãé, Jordi. Universitat Autònoma de Barcelona; España
dc.description.fil
Fil: Levy, Pablo Eduardo. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Miranda, Enrique. Universitat Autònoma de Barcelona; España
dc.journal.title
IEEE Electron Device Letters
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/6717179/
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/LED.2014.2297992
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