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dc.contributor.author
Blasco, Juli  
dc.contributor.author
Ghenzi, Néstor  
dc.contributor.author
Suãé, Jordi  
dc.contributor.author
Levy, Pablo Eduardo  
dc.contributor.author
Miranda, Enrique  
dc.date.available
2018-01-16T15:09:54Z  
dc.date.issued
2014-01  
dc.identifier.citation
Suãé, Jordi; Levy, Pablo Eduardo; Miranda, Enrique; Blasco, Juli; Ghenzi, Néstor; Modeling of the Hysteretic I-V Characteristics of TiO2-Based Resistive Switches Using the Generalized Diode Equation; Institute of Electrical and Electronics Engineers; IEEE Electron Device Letters; 35; 3; 1-2014; 390-392  
dc.identifier.issn
0741-3106  
dc.identifier.uri
http://hdl.handle.net/11336/33395  
dc.description.abstract
An equivalent circuit representation for the conduction characteristics of TiO2-based resistive switches based on the generalized diode equation is reported. The proposed model consists of two antiparallel diodes with series and parallel resistances representing the filamentary current pathway spanning the oxide layer and the possible parasitic conduction effects. The model accounts for the pulse-induced hysteretic behavior exhibited by the I-V characteristic after electroforming. Three different approaches, each one of them with increased complexity, are assessed: 1) constant; 2) nanowire-like; and 3) sigmoidal diode amplitude. In all cases, the logarithmic conductance of the diodes is modeled using a logistic-type threshold function.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Modelling  
dc.subject
Diode  
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Memristor  
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Resistive Switching  
dc.subject.classification
Astronomía  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Modeling of the Hysteretic I-V Characteristics of TiO2-Based Resistive Switches Using the Generalized Diode Equation  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-01-11T13:46:46Z  
dc.identifier.eissn
1558-0563  
dc.journal.volume
35  
dc.journal.number
3  
dc.journal.pagination
390-392  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Thousand Oak  
dc.description.fil
Fil: Blasco, Juli. Universitat Autònoma de Barcelona; España  
dc.description.fil
Fil: Ghenzi, Néstor. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Suãé, Jordi. Universitat Autònoma de Barcelona; España  
dc.description.fil
Fil: Levy, Pablo Eduardo. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Miranda, Enrique. Universitat Autònoma de Barcelona; España  
dc.journal.title
IEEE Electron Device Letters  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/6717179/  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/LED.2014.2297992