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dc.contributor.author
Espinoza Torres, Carlos Aurelio
dc.contributor.author
Condo, Adriana Maria
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Haberkorn, Nestor Fabian
dc.contributor.author
Zelaya, Maria Eugenia
dc.contributor.author
Schryvers. D.
dc.contributor.author
Guimpel, Julio Juan
dc.contributor.author
Lovey, Francisco Carlos
dc.date.available
2018-01-10T18:00:10Z
dc.date.issued
2014-08
dc.identifier.citation
Lovey, Francisco Carlos; Zelaya, Maria Eugenia; Condo, Adriana Maria; Espinoza Torres, Carlos Aurelio; Haberkorn, Nestor Fabian; Guimpel, Julio Juan; et al.; Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering; Elsevier Inc; Materials Characterization; 96; 8-2014; 256-262
dc.identifier.issn
1044-5803
dc.identifier.uri
http://hdl.handle.net/11336/32841
dc.description.abstract
The structure and texture formation in Cu–Al–Ni thin films of different thicknesses (1 μm to 5 μm) grown by DC magnetron sputtering without any intentional heating of the substrate are reported. The as-grown films present grains with an average size of 20 nm. The films with thickness of 1 μm have a single metastable phase with a hexagonal structure and are textured with planes (0002) parallel to the plane of the films. It was observed that thicker films present phase coexistence between metastable hexagonal and body centered cubic structures with a gradual increment of the body centered cubic phase fraction. The films with thickness of 5 μm are textured with planes (0002) and 1010 n o in the hexagonal structure, whereas in the body centered cubic structure the films are textured with {110} planes parallel to the plane of the films. This fact can be associated with selfheating of the substrate during the growth of the films and with the relative stability of the metastable phases. Free standing films annealed in a second step (1123 K for 1 h) present austenitic phase with L21 structure and sub-micrometric grains textured with {220}L21 planes parallel to the plane of the films. The martensitic transformation temperature was determined from the analysis of resistance against temperature measurements.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Inc
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.subject
Thin Film
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Shape Memory
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Cu-Al-Ni
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Astronomía
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-01-05T16:25:31Z
dc.journal.volume
96
dc.journal.pagination
256-262
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Espinoza Torres, Carlos Aurelio. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Condo, Adriana Maria. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Haberkorn, Nestor Fabian. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Zelaya, Maria Eugenia. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Schryvers. D.. Universiteit Antwerpen; Bélgica
dc.description.fil
Fil: Guimpel, Julio Juan. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Lovey, Francisco Carlos. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina
dc.journal.title
Materials Characterization
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.matchar.2014.08.005
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S1044580314002460
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