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dc.contributor.author
Filippin, Francisco Angel
dc.contributor.author
Linarez Pérez, Omar Ezequiel
dc.contributor.author
Lopez Teijelo, Manuel
dc.contributor.author
Bonetto, Rita Dominga
dc.contributor.author
Trincavelli, Jorge Carlos
dc.contributor.author
Avalle, Lucia Bernardita
dc.date.available
2017-12-26T19:03:12Z
dc.date.issued
2014-03
dc.identifier.citation
Avalle, Lucia Bernardita; Bonetto, Rita Dominga; Lopez Teijelo, Manuel; Linarez Pérez, Omar Ezequiel; Filippin, Francisco Angel; Trincavelli, Jorge Carlos; et al.; Thickness determination of electrochemical titanium oxide (Ti/TiO2) formed in HClO4 solutions; Pergamon-Elsevier Science Ltd.; Electrochimica Acta; 129; 3-2014; 266-275
dc.identifier.issn
0013-4686
dc.identifier.uri
http://hdl.handle.net/11336/31573
dc.description.abstract
Anodic Titanium oxide films were potentiodinamically grown on Ti foil and glass/Ti in 0.010 M HClO4 at 50 mVs−1. The current density-potential curves (j − E) showed that the oxide grows according to the physical model for high-field conduction. However, for final potential (Ef) higher than 1.5 V vs. Ag/AgCl (sat. KCl) the oxygen evolution reaction becomes more significant, and the formation of bubbles prevented or made more difficult the application of in situ techniques for the simultaneous study of the thickness and optical properties of the anodic layer. We developed a method based on electron probe microanalysis (EPMA) to calculate oxide thickness using ex situ ellipsometry as a reference technique. The normalized intensity of the O Kα peaks was measured for anodic oxides corresponding to Ef values from spontaneous oxide up to 50 V, where a linear relationship was observed for a narrower range of final potentials. This behaviour was studied with Monte Carlo simulations. After calibration with ellipsometric results, to take into account sample damage during the electron irradiation, EPMA was applied as a method for thickness determination at Ef ≥ 1.0 V. Once the method was established, ex situ thickness determinations became independent of the preparation method of the oxide layer, which represents a comparative advantage against ex situ ellipsometry.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Pergamon-Elsevier Science Ltd.
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Electrochemistry
dc.subject
Ellipsometry
dc.subject
Epma
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Oxide Growth
dc.subject
Tio2
dc.subject.classification
Astronomía
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Ciencias Físicas
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS
dc.title
Thickness determination of electrochemical titanium oxide (Ti/TiO2) formed in HClO4 solutions
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-12-21T17:00:28Z
dc.journal.volume
129
dc.journal.pagination
266-275
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Filippin, Francisco Angel. Universidad Nacional de Catamarca; Argentina
dc.description.fil
Fil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
dc.description.fil
Fil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
dc.description.fil
Fil: Bonetto, Rita Dominga. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigación y Desarrollo en Ciencias Aplicadas "Dr. Jorge J. Ronco". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Investigación y Desarrollo en Ciencias Aplicadas; Argentina
dc.description.fil
Fil: Trincavelli, Jorge Carlos. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
dc.description.fil
Fil: Avalle, Lucia Bernardita. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
dc.journal.title
Electrochimica Acta
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.electacta.2014.02.086
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0013468614004009
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