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dc.contributor.author
Garcia, Alejandra
dc.contributor.author
Raya, Andres M.
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Mariscal, Marcelo
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Esparza, Rodrigo
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Herrera, M.iriam
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Molina, Sergio I.
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Scavello, Giovanni
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Galindo, Pedro L.
dc.contributor.author
Yacamán, Miguel Jose
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Ponce, Arturo
dc.date.available
2017-12-22T13:25:16Z
dc.date.issued
2014-06
dc.identifier.citation
Garcia, Alejandra; Raya, Andres M.; Mariscal, Marcelo; Esparza, Rodrigo; Herrera, M.iriam; et al.; Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging; Elsevier Science; Ultramicroscopy; 146; 6-2014; 33-38
dc.identifier.issn
0304-3991
dc.identifier.uri
http://hdl.handle.net/11336/31351
dc.description.abstract
In this work we examined MoS2sheets by aberration-corrected scanning transmission electron micro-scopy (STEM) at three different energies: 80, 120 and 200 kV. Structural damage of the MoS2sheets hasbeen controlled at 80 kV according a theoretical calculation based on the inelastic scattering of theelectrons involved in the interaction electron–matter. The threshold energy for the MoS2material hasbeen found and experimentally verified in the microscope. At energies higher than the energy thresholdwe show surface and edge defects produced by the electron beam irradiation. Quantitative analysis atatomic level in the images obtained at 80 kV has been performed using the experimental images and viaSTEM simulations using SICSTEM software to determine the exact number of MoS2layers.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Low-Voltage Transmission Electron
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Microscopy
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Aberration-Corrected Microscopy
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Molybdenum Disulfide
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Radiation Damage
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Nano-materiales
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Nanotecnología
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-12-21T16:26:12Z
dc.journal.volume
146
dc.journal.pagination
33-38
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Garcia, Alejandra. University of Texas at San Antonio. San Antonio; Estados Unidos
dc.description.fil
Fil: Raya, Andres M.. Universidad de Cádiz; España
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Fil: Mariscal, Marcelo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
dc.description.fil
Fil: Esparza, Rodrigo. University of Texas at San Antonio. San Antonio; Estados Unidos
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Fil: Herrera, M.iriam. Universidad de Cádiz; España
dc.description.fil
Fil: Molina, Sergio I.. Universidad de Cádiz; España
dc.description.fil
Fil: Scavello, Giovanni. Universidad de Cádiz; España
dc.description.fil
Fil: Galindo, Pedro L.. Universidad de Cádiz; España
dc.description.fil
Fil: Yacamán, Miguel Jose. University of Texas at San Antonio. San Antonio; Estados Unidos
dc.description.fil
Fil: Ponce, Arturo. University of Texas at San Antonio. San Antonio; Estados Unidos
dc.journal.title
Ultramicroscopy
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.ultramic.2014.05.004
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0304399114001041
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