Mostrar el registro sencillo del ítem
dc.contributor.author
de Vincentis, Natalia Soledad
dc.contributor.author
Muñoz, Jairo A.
dc.contributor.author
Benatti, Emanuel Alejandro
dc.contributor.author
Sandim, Hugo R.Z.
dc.contributor.author
Avalos, Martina Cecilia
dc.contributor.author
Brokmeier, H. G.
dc.contributor.author
Bolmaro, Raul Eduardo
dc.date.available
2025-12-09T12:16:10Z
dc.date.issued
2025-11
dc.identifier.citation
de Vincentis, Natalia Soledad; Muñoz, Jairo A.; Benatti, Emanuel Alejandro; Sandim, Hugo R.Z.; Avalos, Martina Cecilia; et al.; A study combining EBSD and x-ray synchrotron diffraction using generalized pole figures; Elsevier Science Inc.; Materials Characterization; 229; 11-2025; 1-12
dc.identifier.issn
1044-5803
dc.identifier.uri
http://hdl.handle.net/11336/277130
dc.description.abstract
The development of advanced materials with optimum structural and mechanical properties requires a detailed control of their microstructures, textures and crystalline defects. Different techniques can be used for the characterization of those microstructures and defects, but it is their combination that could result in an exhaustive understanding of the microstructural and orientational developments on these materials.X-Ray Diffraction (XRD) can be employed to obtain a “global” characterization of microstructure and texture, since the presence of defects in the sample produces shift and broadening of diffraction peaks. Different models have been developed to quantify these defects, some of which require fitting the complete diffraction pattern while others just individual peaks. These techniques can be extended to texture measurements, often represented through pole figures (PFs), wherein diffraction patterns are obtained for different sample orientations. This allows the determination of defect density in function of orientations and their representation in Generalized Pole Figures (GPFs).On the other hand, for a more “local” characterization, Electron Backscatter Diffraction (EBSD) has proven to be extremely useful for microstructural and orientational analysis, allowing to assess defect accumulation in individual grains and orientations.In this work, a set of 32,205 duplex steel samples cold-rolled up to 79 % reduction (in steps of approximately 20 %) are studied, aiming to investigate the evolution of defect storage with deformation in different orientations and texture components. For this purpose, Laue diffraction patterns have been obtained for these samples in P07 beamline in Petra III station (DESY), from which PFs and GPFs were obtained. This information is complemented with EBSD results, where dislocation arrays and grain and subgrain structures for particular orientations are studied. This paper not only aims at describing the microstructural evolution of a cold rolled duplex steel with increasing deformation, providing both a local and a global characterization of this microstructure, but also at exploring the capabilities of the diffraction techniques used for this purpose. The combination of both techniques allowed for an exhaustive analysis of defect storage and microstructural orientations developed with increasing deformation.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science Inc.
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
MICROSTRUCTURE
dc.subject
GENERALIZED POLE FIGURES
dc.subject
X-RAY DIFFRACTION
dc.subject
EBSD
dc.subject.classification
Ingeniería de los Materiales
dc.subject.classification
Ingeniería de los Materiales
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
A study combining EBSD and x-ray synchrotron diffraction using generalized pole figures
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2025-12-05T14:25:30Z
dc.journal.volume
229
dc.journal.pagination
1-12
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: de Vincentis, Natalia Soledad. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina
dc.description.fil
Fil: Muñoz, Jairo A.. Universidad Politécnica de Catalunya; España
dc.description.fil
Fil: Benatti, Emanuel Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina
dc.description.fil
Fil: Sandim, Hugo R.Z.. Universidade de Sao Paulo; Brasil
dc.description.fil
Fil: Avalos, Martina Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina
dc.description.fil
Fil: Brokmeier, H. G.. Clausthal University of Technology; Alemania
dc.description.fil
Fil: Bolmaro, Raul Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina
dc.journal.title
Materials Characterization
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://linkinghub.elsevier.com/retrieve/pii/S1044580325009301
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.matchar.2025.115641
Archivos asociados