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Artículo

Highly Sensitive Direct Measurement of Magnetostriction and Stress Response in Near-Zero Magnetostrictive Microwires

Moya, Javier AlbertoIcon ; Vázquez, Manuel
Fecha de publicación: 08/2025
Editorial: Institute of Electrical and Electronics Engineers
Revista: IEEE Transactions on Magnetics
ISSN: 0018-9464
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Otras Ingeniería de los Materiales

Resumen

The evaluation of magnetostriction in amorphous alloy materials, particularly in the form of microwires, has traditionally relied on indirect methods utilizing inverse magnetoelastic effects to determine the saturation magnetostriction constant, λs. In this study, we report direct magnetostriction measurements using a home-made apparatus capable of determining the engineering magnetostriction, λe, with high sensitivity down to than δl/ lo = 10−9 as a function of the applied field, λe(H), and its stress-dependent, λe(σ ), and magnetization, λe(M), behaviors. Measurements were conducted on in-water-quenched amorphous microwires, including Co-based microwires with vanishing magnetostriction, as well as in a highly magnetostrictive microwire. In addition, the indirect method was used to calculate saturation magnetostriction constant, λs, using the complementary hysteresis loops under applied stress. For Fe-rich Fe75Si10 B15 microwires, λs = 31.2 × 10−6 was determined. In contrast, for Co-rich microwires, the (Co94Fe6)15Si15B10 alloy exhibited near-zero positive magnetostriction with λs = 9.7 × 10−8, while (Co95Fe5)15Si15B10 displayed a slight negative magnetostriction λs = −17 × 10−8. The behavior of magnetostrictive strain under mechanical stress in near-zero magnetostrictive alloys, as observed from direct measurements, shows significant differences compared to indirect measurements found in the literature. Direct measurement of magnetostriction in amorphous microwires provides the magnetostriction value of the material according to its stress state, essential for accurately quantifying magnetostriction in sensors during operation, ensuring more precise and dependable results.
Palabras clave: AMORPHOUS MICROWIRES , MAGNETIZATION PROCESS , MAGNETOSTRICTION , STRESS RESPONSE
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info:eu-repo/semantics/restrictedAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/274365
URL: https://ieeexplore.ieee.org/document/11027432/
DOI: http://dx.doi.org/10.1109/TMAG.2025.3577435
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Articulos(CCT - SALTA-JUJUY)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - SALTA-JUJUY
Citación
Moya, Javier Alberto; Vázquez, Manuel; Highly Sensitive Direct Measurement of Magnetostriction and Stress Response in Near-Zero Magnetostrictive Microwires; Institute of Electrical and Electronics Engineers; IEEE Transactions on Magnetics; 61; 8; 8-2025; 1-9
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