Artículo
An ultra-low noise fully-differential amplifier
Fecha de publicación:
10/2024
Editorial:
Institute of Electrical and Electronics Engineers
Revista:
Ieee Transactions on Instrumentation and Measurement
ISSN:
0018-9456
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
A general-purpose instrumentation amplifier must be dc-coupled and has a differential input to handle both differential and single-ended input signals. It must also exhibit low input noise in both voltage and current to accommodate a wide range of signal source impedances. Additionally, having a differential output is desirable to allow direct connection to current high-resolution analog-to-digital converters (ADCs), which have differential inputs. There are commercially available devices with en voltage noise spectral densities as low as 1 nV/Hz−−−√ but present high current noise spectral densities in of a few pA/Hz−−−√ . On the other hand, there are also devices with in as low as a few fA/Hz−−−√ but presenting en around 10 nV/Hz−−−√ . To obtain low values of both en and in , a fully differential circuit topology combining discrete junction field transistors (JFETs) and operational amplifiers (OAs) is proposed. Design equations, stability analysis, and experimental results are presented. As an example, a fully differential instrumentation amplifier has been designed, built, and tested showing en<1 nV/Hz−−−√ at 1 kHz and in<10 fA/Hz−−−√ at 1 kHz. The proposed topology finds applications, such as front ends for measuring and testing instruments, industrial instrumentation, and audio circuits.
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(LEICI)
Articulos de INSTITUTO DE INVESTIGACIONES EN ELECTRONICA, CONTROL Y PROCESAMIENTO DE SEÑALES
Articulos de INSTITUTO DE INVESTIGACIONES EN ELECTRONICA, CONTROL Y PROCESAMIENTO DE SEÑALES
Citación
Spinelli, Enrique Mario; Haberman, Marcelo Alejandro; An ultra-low noise fully-differential amplifier; Institute of Electrical and Electronics Engineers; Ieee Transactions on Instrumentation and Measurement; 73; 10-2024; 1-8
Compartir
Altmétricas