Artículo

Arsenic speciation by X-ray spectroscopy using resonant Raman scattering

Sanchez, Hector JorgeIcon ; Leani, Juan JoseIcon ; Perez, C. A.; Perez, Roberto DanielIcon
Fecha de publicación: 12/2013
Editorial: Springer
Revista: Journal Of Applied Spectroscopy
ISSN: 0021-9037
e-ISSN: 1573-8647
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

We have shown that X-ray resonant Raman scattering (RRS) spectroscopy can be used to analyze arsenic species. This work is pioneer in the area and an important work on the result interpretation is necessary in the future. Nevertheless, this behavior in the RRS residuals of compounds can be used to identify the oxidation state of the elements under study, offering a new possibility of the chemical environment determination using RRS spectroscopy.
Palabras clave: X Ray Resonant , Raman Scattering , Arsenic
 
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info:eu-repo/semantics/restrictedAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/24901
URL: https://link.springer.com/article/10.1007/s10812-014-9864-2
DOI: http://dx.doi.org/10.1007/s10812-014-9864-2
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Citación
Sanchez, Hector Jorge; Leani, Juan Jose; Perez, C. A.; Perez, Roberto Daniel; Arsenic speciation by X-ray spectroscopy using resonant Raman scattering; Springer; Journal Of Applied Spectroscopy; 80; 6; 12-2013; 912-916
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