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dc.contributor.author
Cortés, C. A.  
dc.contributor.author
Mombello, Enrique Esteban  
dc.contributor.author
Dib, Ramzi  
dc.contributor.author
Rattá, Giuseppe  
dc.date.available
2024-11-26T14:14:03Z  
dc.date.issued
2007-09  
dc.identifier.citation
Cortés, C. A.; Mombello, Enrique Esteban; Dib, Ramzi; Rattá, Giuseppe; A new class of flat-top windows for exposure assessment in magnetic field measurements; Elsevier Science; Signal Processing; 87; 9; 9-2007; 2151-2164  
dc.identifier.issn
0165-1684  
dc.identifier.uri
http://hdl.handle.net/11336/248681  
dc.description.abstract
Efficient signal processing techniques are necessary for assessing the exposure to broadband magnetic fields. The use of flat-top windows along with the DFT is a simple and fast method that reduces the characteristic leakage errors and picket fence effects when using the classical DFT for the exposure assessment. This paper proposes a new class of flat-top windows, making a trade-off between the sidelobe fall-off and the maximum sidelobe height, called fast-decayingminimum-sidelobe (FDMS) flat-top windows. Moreover, the procedure used to find the coefficients of the optimal flat-top windows is reviewed, and a new procedure is proposed in order to find the flat-top window coefficients that uses multiobjective optimization and an appropriate selection of constraints. Using this procedure, a new minimum sidelobe (MS)flat-top window with four terms is also found, having better characteristics than a previously proposed 4-term MS flat-top window. In addition, a new MS flat-top window with five terms is  proposed having a maximum sidelobe level of -95.15 dB. These windows are used to propose a method for assessing the exposure to broadband magnetic fields using flat-top windows and the DFT.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier Science  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Windowing  
dc.subject
Flat-top windows  
dc.subject
Fourier analysis  
dc.subject
DFT  
dc.subject
EMF exposure assessment  
dc.subject
Magnetic field  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
A new class of flat-top windows for exposure assessment in magnetic field measurements  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2024-11-15T14:59:09Z  
dc.journal.volume
87  
dc.journal.number
9  
dc.journal.pagination
2151-2164  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Amsterdam  
dc.description.fil
Fil: Cortés, C. A.. Universidad de la Salle; Colombia  
dc.description.fil
Fil: Mombello, Enrique Esteban. Universidad Nacional de San Juan. Facultad de Ingeniería. Instituto de Energía Eléctrica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - San Juan; Argentina  
dc.description.fil
Fil: Dib, Ramzi. University of Applied Sciences Giessen-Friedberg; Alemania  
dc.description.fil
Fil: Rattá, Giuseppe. Universidad Nacional de San Juan. Facultad de Ingeniería. Instituto de Energía Eléctrica; Argentina  
dc.journal.title
Signal Processing  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0165168407000862  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.sigpro.2007.02.012