Artículo
Spreading of a thin two-dimensional strip of fluid on a vertical plane: Experiments and modeling
Gonzalez, Alejandro Guillermo
; Diez, Javier Alberto
; Gomba, Juan Manuel
; Gratton, Roberto
; Kondic, L.
Fecha de publicación:
08/2004
Editorial:
American Physical Society
Revista:
Physical Review E: Statistical, Nonlinear and Soft Matter Physics
ISSN:
1539-3755
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We study the thin-film flow of a constant volume of silicon oil (polydymethilsiloxane) spreading down a vertical glass plate. The initial condition is generated from a horizontal fluid filament of typical diameter 0.4 mm. Two optical diagnostic methods are used: One based on an anamorphic system, and the other on the Schlieren method. The first one allows for a detailed characterization of the early stable stage of the spreading which is used to estimate the thickness of the precursor film needed to model the flow. The second one captures the bidimensional pattern of the transversal film instability. We use these techniques to determine the film thickness profiles, and the evolution of the moving contact line, including its shape and Fourier spectra. The numerical simulations of the stable stage of spreading are in good quantitative agreement with the experimental results. We develop a model based on linear stability theory that predicts the evolution of the modes present in the linear stage of the instability.
Palabras clave:
FLOW INSTABILITIES
,
LIQUID THIN FILMS
,
STABILITY OF LAMINAR FLOWS
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(CCT - TANDIL)
Articulos de CTRO CIENTIFICO TECNOLOGICO CONICET - TANDIL
Articulos de CTRO CIENTIFICO TECNOLOGICO CONICET - TANDIL
Citación
Gonzalez, Alejandro Guillermo; Diez, Javier Alberto; Gomba, Juan Manuel; Gratton, Roberto; Kondic, L.; Spreading of a thin two-dimensional strip of fluid on a vertical plane: Experiments and modeling; American Physical Society; Physical Review E: Statistical, Nonlinear and Soft Matter Physics; 70; 2; 8-2004; 2630901-2630918
Compartir
Altmétricas