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dc.contributor.author
Txoperena, Oihana  
dc.contributor.author
Gobbi, Marco  
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Bedoya Pinto, Amilcar  
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Golmar, Federico  
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Sun, Xiangnan  
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Hueso, Luis E.  
dc.contributor.author
Casanova, Félix  
dc.date.available
2017-09-13T14:34:44Z  
dc.date.issued
2013-05  
dc.identifier.citation
Txoperena, Oihana; Gobbi, Marco; Bedoya Pinto, Amilcar; Golmar, Federico; Sun, Xiangnan; et al.; How reliable are Hanle measurements in metals in a three-terminal geometry?; American Institute of Physics; Applied Physics Letters; 102; 19; 5-2013; 1-5; 192406  
dc.identifier.issn
0003-6951  
dc.identifier.uri
http://hdl.handle.net/11336/24115  
dc.description.abstract
We test the validity of Hanle measurements in three-terminal devices by using aluminum (Al) and gold (Au). The obtained Hanle and inverted Hanle-like curves show an anomalous behavior. First, we measure Hanle signals 8 orders of magnitude larger than those predicted by standard theory. Second, the temperature and voltage dependences of the signal do not match with the tunneling spin polarization of the ferromagnetic contact. Finally, the spin relaxation times obtained with this method are independent of the choice of the metallic channel. These results are not compatible with spin accumulation in the metal. Furthermore, a scaling of the Hanle signal with the interface resistance of the devices suggests that the measured signal is originated in the tunnel junction.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Hanle Effect  
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Magnetoelectronics  
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Ferromagnetic Materials  
dc.subject.classification
Otras Ciencias Físicas  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
How reliable are Hanle measurements in metals in a three-terminal geometry?  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-09-12T16:29:18Z  
dc.journal.volume
102  
dc.journal.number
19  
dc.journal.pagination
1-5; 192406  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Maryland  
dc.description.fil
Fil: Txoperena, Oihana. CIC nanoGUNE; España  
dc.description.fil
Fil: Gobbi, Marco. CIC nanoGUNE; España  
dc.description.fil
Fil: Bedoya Pinto, Amilcar. CIC nanoGUNE; España  
dc.description.fil
Fil: Golmar, Federico. CIC nanoGUNE; España. Instituto Nacional de Tecnología Industrial; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Sun, Xiangnan. CIC nanoGUNE; España  
dc.description.fil
Fil: Hueso, Luis E.. Basque Foundation for Science; España. CIC nanoGUNE; España  
dc.description.fil
Fil: Casanova, Félix. Basque Foundation for Science; España. CIC nanoGUNE; España  
dc.journal.title
Applied Physics Letters  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4806987  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4806987