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dc.contributor.author
Pazos, Sebastian  
dc.contributor.author
Zheng, Wenwen  
dc.contributor.author
Zanotti, Tommaso  
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Aguirre, Fernando  
dc.contributor.author
Becker, Thales  
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Shen, Yaqing  
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Zhu, Kaichen  
dc.contributor.author
Yuan, Yue  
dc.contributor.author
Wirth, Gilson  
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Puglisi, Francesco Maria  
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Roldán, Juan Bautista  
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Palumbo, Félix Roberto Mario  
dc.contributor.author
Lanza, Mario  
dc.date.available
2024-07-03T13:48:41Z  
dc.date.issued
2023-07  
dc.identifier.citation
Pazos, Sebastian; Zheng, Wenwen; Zanotti, Tommaso; Aguirre, Fernando; Becker, Thales; et al.; Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller; Royal Society of Chemistry; Nanoscale; 15; 5; 7-2023; 2171-2180  
dc.identifier.issn
2040-3364  
dc.identifier.uri
http://hdl.handle.net/11336/238922  
dc.description.abstract
The development of the internet-of-things requires cheap, light, small and reliable true random number generator (TRNG) circuits to encrypt the data—generated by objects or humans—before transmitting them. However, all current solutions consume too much power and require a relatively large battery, hindering the integration of TRNG circuits on most objects. Here we fabricated a TRNG circuit by exploiting stable random telegraph noise (RTN) current signals produced by memristors made of two-dimensional (2D) multi-layered hexagonal boron nitride (h-BN) grown by chemical vapor deposition and coupled with inkjet-printed Ag electrodes. When biased at small constant voltages (≤70 mV), the Ag/h-BN/Ag memristors exhibit RTN signals with very low power consumption (∼5.25 nW) and a relatively high current on/off ratio (∼2) for long periods (>1 hour). We constructed TRNG circuits connecting an h-BN memristor to a small, light and cheap ommercial microcontroller, producing a highly-stochastic, high-throughput signal (up to 7.8 Mbit s−1) even if the RTN at the input gets interrupted for long times up to 20 s, and if the stochasticity of the RTN signal is reduced. Our study presents the first full hardware implementation of 2Dmaterial-based TRNGs, enabled by the unique stability and figures of merit of the RTN signals in h-BN based memristors.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Royal Society of Chemistry  
dc.rights
info:eu-repo/semantics/restrictedAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
RRAM  
dc.subject
RTN  
dc.subject
dielectric  
dc.subject.classification
Nano-materiales  
dc.subject.classification
Nanotecnología  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2024-06-24T09:51:13Z  
dc.identifier.eissn
2040-3372  
dc.journal.volume
15  
dc.journal.number
5  
dc.journal.pagination
2171-2180  
dc.journal.pais
Estados Unidos  
dc.description.fil
Fil: Pazos, Sebastian. King Abdullah University of Science and Technology; Arabia Saudita. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina  
dc.description.fil
Fil: Zheng, Wenwen. King Abdullah University of Science and Technology; Arabia Saudita  
dc.description.fil
Fil: Zanotti, Tommaso. Università di Modena e Reggio Emilia; Italia  
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Fil: Aguirre, Fernando. Universitat Autònoma de Barcelona; España  
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Fil: Becker, Thales. Universidade Federal do Rio Grande do Sul; Brasil  
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Fil: Shen, Yaqing. King Abdullah University of Science and Technology; Arabia Saudita  
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Fil: Zhu, Kaichen. Universidad de Barcelona; España  
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Fil: Yuan, Yue. Shanghai Institute Of Microsystem And Information Technology Chinese Academy Of Sciences; China  
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Fil: Wirth, Gilson. Universidade Federal do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Puglisi, Francesco Maria. Università di Modena e Reggio Emilia; Italia  
dc.description.fil
Fil: Roldán, Juan Bautista. Universidad de Granada; España  
dc.description.fil
Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina  
dc.description.fil
Fil: Lanza, Mario. King Abdullah University of Science and Technology; Arabia Saudita  
dc.journal.title
Nanoscale  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://xlink.rsc.org/?DOI=D2NR06222D  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1039/D2NR06222D