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dc.contributor.author
Alcalde Bessia, Fabricio Pablo
dc.contributor.author
England, Troy
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Sun, Hongzhi
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Stefanazzi, Leandro
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Braga, Davide
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Sofo Haro, Miguel Francisco
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Li, Shaorui
dc.contributor.author
Estrada, Juan
dc.contributor.author
Fahim, Farah
dc.date.available
2024-02-14T11:51:38Z
dc.date.issued
2023-04
dc.identifier.citation
Alcalde Bessia, Fabricio Pablo; England, Troy; Sun, Hongzhi; Stefanazzi, Leandro; Braga, Davide; et al.; A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC; Institute of Electrical and Electronics Engineers; IEEE Transactions on Circuits and Systems I: Regular Papers; 70; 6; 4-2023; 2306-2316
dc.identifier.issn
1549-8328
dc.identifier.uri
http://hdl.handle.net/11336/226754
dc.description.abstract
The MIDNA application specific integrated circuit (ASIC) is a skipper-CCD readout chip fabricated in a 65nm LP-CMOS process that is capable of working at cryogenic temperatures. The chip integrates four front-end channels that process the skipper-CCD signal and performs differential averaging using a dual slope integration (DSI) circuit. Each readout channel contains a pre-amplifier, a DC restorer, and a dual-slope integrator with chopping capability. The integrator chopping is a key system design element in order to mitigate the effect of low-frequency noise produced by the integrator itself, and it is not often required with standard CCDs. Each channel consumes 4.5 mW of power, occupies 0.156 mm 2 area and has an input referred noise of 2.7 μ Vrms. It is demonstrated experimentally to achieve sub-electron noise when coupled with a skipper-CCD by means of averaging samples of each pixel. Sub-electron noise is shown in three different acquisition approaches. The signal range is 6000 electrons. The readout system achieves 0.2 e- RMS by averaging 1000 samples with MIDNA both at room temperature and at 180Kelvin.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
CORRELATED DOUBLE SAMPLING
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CRYOGENIC
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LOW NOISE
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Ingeniería Eléctrica y Electrónica
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2024-02-08T10:55:35Z
dc.journal.volume
70
dc.journal.number
6
dc.journal.pagination
2306-2316
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Alcalde Bessia, Fabricio Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche | Comisión Nacional de Energía Atómica. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología. Unidad Ejecutora Instituto de Nanociencia y Nanotecnología - Nodo Bariloche; Argentina
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Fil: England, Troy. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Sun, Hongzhi. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Stefanazzi, Leandro. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Braga, Davide. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Sofo Haro, Miguel Francisco. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
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Fil: Li, Shaorui. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Estrada, Juan. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Fahim, Farah. Fermi National Accelerator Laboratory; Estados Unidos
dc.journal.title
IEEE Transactions on Circuits and Systems I: Regular Papers
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/10102286/
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TCSI.2023.3256860
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