Artículo
Resolution, accuracy and precision in super-resolved microscopy images using SUPPOSe
Fecha de publicación:
02/2023
Editorial:
Elsevier
Revista:
Optics And Lasers In Engineering
ISSN:
0143-8166
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
In this work we carry out a performance analysis of the SUPPOSe (Superposition of virtual point sources) algorithm, a deconvolution method with super-resolution for single images based on the superposition of point sources of equal intensity. By testing the method with synthetic and experimental images, we determine the extent of the accuracy, precision and resolution of the method and how these parameters are modified under different signal/noise conditions. Performing simulations with a numerical aperture NA∼1.3 and an emission wavelength λ=520nm, a SUPPOSe resolution of 75-80nm with an accuracy of 20nm and a precision of 10nm is shown to be possible. We also tested the method with experimental images, biological structures and fluorescent substrates from calibration samples, obtaining results consistent with the improvements obtained in the simulations.
Palabras clave:
DECONVOLUTION
,
FLUORESCENCE
,
IMAGE RESOLUTION
,
MICROSCOPY
,
SUPERRESOLUTION
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Identificadores
Colecciones
Articulos(IMAS)
Articulos de INSTITUTO DE INVESTIGACIONES MATEMATICAS "LUIS A. SANTALO"
Articulos de INSTITUTO DE INVESTIGACIONES MATEMATICAS "LUIS A. SANTALO"
Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Articulos de SEDE CENTRAL
Citación
Toscani, Micaela; Martinez, Oscar Eduardo; Martinez, Sandra Rita; Resolution, accuracy and precision in super-resolved microscopy images using SUPPOSe; Elsevier; Optics And Lasers In Engineering; 161; 2-2023; 1-15
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