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dc.contributor.author
Fernandez Corazza, Mariano  
dc.contributor.author
Beltrachini, Leandro  
dc.contributor.author
Von Ellenrieder, Nicolás  
dc.contributor.author
Muravchik, Carlos Horacio  
dc.date.available
2017-08-09T13:58:42Z  
dc.date.issued
2013-04  
dc.identifier.citation
Fernandez Corazza, Mariano; Beltrachini, Leandro; Von Ellenrieder, Nicolás; Muravchik, Carlos Horacio; Waveform selection for electrical impedance tomography; Institute of Electrical and Electronics Engineers; IEEE Latin America Transactions; 11; 1; 4-2013; 402-407  
dc.identifier.issn
1548-0992  
dc.identifier.uri
http://hdl.handle.net/11336/22098  
dc.description.abstract
Electrical Impedance Tomography (EIT) is a non– invasive method that can be used to estimate the electrical conductivity of the head tissues. It is based on the measurement of electric potential on the scalp generated by the injection of a small electric current. If the generated electric potential distribution is measured with an Electroencephalography (EEG) equipment, the neural activity of the brain will produce signals that may affect the EIT measurements. In the present work we propose a method to reduce the effect of these signals and show a procedure to obtain the minimum number of samples that is needed to neglect the effect of the brain activity. The method requires the obtention of the optimum waveform for the applied current to minimize the variance of the electric potential estimation. As an example, the method is applied to two sets of EEG measurements of two patients, and we determine the optimum waveform and minimum number of samples for each measurement set. We also show that the replacement of the optimum waveform by a sinusoid with arbitrary phase does not significantly affect the estimations, but a previous spectral analysis of the brain activity must be performed in order to determine convenient frequencies.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Electrical Impedance Tomography  
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Waveform Estimation  
dc.subject
Number of Samples  
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Electroencephalography  
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Waveform selection for electrical impedance tomography  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-08-04T14:00:35Z  
dc.journal.volume
11  
dc.journal.number
1  
dc.journal.pagination
402-407  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Nueva York  
dc.description.fil
Fil: Fernandez Corazza, Mariano. Universidad Nacional de La Plata; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Beltrachini, Leandro. Universidad Nacional de La Plata; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Von Ellenrieder, Nicolás. Universidad Nacional de La Plata; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Muravchik, Carlos Horacio. Universidad Nacional de La Plata; Argentina. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
IEEE Latin America Transactions  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/6502837/  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TLA.2013.6502837