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Artículo

Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces

Barber, Matias ErnestoIcon ; Grings, Francisco MatiasIcon ; Álvarez Mozos, Jesus; Piscitelli, Marcela; Perna, Pablo AlejandroIcon ; Karszenbaum, HaydeeIcon
Fecha de publicación: 05/2016
Editorial: MDPI
Revista: Remote Sensing
ISSN: 2072-4292
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Oceanografía, Hidrología, Recursos Hídricos

Resumen

The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band.
Palabras clave: CORRELATION LENGTH , HEIGHT STANDARD DEVIATION , LASER PROFILER , RADAR APPLICATIONS , SCATTERING MODELS , SURFACE SOIL ROUGHNESS
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution 2.5 Unported (CC BY 2.5)
Identificadores
URI: http://hdl.handle.net/11336/21541
URL: http://www.mdpi.com/2072-4292/8/6/458
DOI: http://dx.doi.org/10.3390/rs8060458
Colecciones
Articulos(IAFE)
Articulos de INST.DE ASTRONOMIA Y FISICA DEL ESPACIO(I)
Citación
Barber, Matias Ernesto; Grings, Francisco Matias; Álvarez Mozos, Jesus; Piscitelli, Marcela; Perna, Pablo Alejandro; et al.; Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces; MDPI; Remote Sensing; 8; 6; 5-2016; 458,1-19
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