Artículo
Real-space direct visualization of the layer-dependent roughening transition in nanometer-thick Pb films
Calleja, F.; Passeggi, Mario Cesar Guillermo
; Hinarejos, J. J.; López Vázquez de Parga, A.; Miranda, R.
Fecha de publicación:
12/2006
Editorial:
American Physical Society
Revista:
Physical Review Letters
ISSN:
0031-9007
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
By means of variable-temperature scanning tunneling microscopy and spectroscopy we studied the thickness-dependent roughening temperature of Pb films grown on Cu(111), whose electronic structure and total energy is controlled by quantum well states created by the spatial confinement of electrons. Large scale STM images are employed to quantify the layer population, i.e., the fraction of the surface area covered by different Pb thicknesses, directly in the real space as a function of temperature. The roughening temperature oscillates repeatedly with bilayer periodicity plus a longer beating period, mirroring the thickness dependence of surface energy calculations. Conditions have been found to stabilize at 300 K Pb films of particular magic thicknesses, atomically flat over microns.
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Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Citación
Calleja, F.; Passeggi, Mario Cesar Guillermo; Hinarejos, J. J.; López Vázquez de Parga, A.; Miranda, R.; Real-space direct visualization of the layer-dependent roughening transition in nanometer-thick Pb films; American Physical Society; Physical Review Letters; 97; 18; 12-2006; 1861041-1861044
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