Artículo
SENSEI: Characterization of Single-Electron Events Using a Skipper Charge-Coupled Device
Barak, Liron; Bloch, Itay M.; Botti, Ana Martina
; Cababie, Mariano Ruben
; Cancelo, Gustavo Indalecio; Chaplinsky, Luke; Chierchie, Fernando
; Crisler, Michael; Drlica Wagner, Alex; Essig, Rouven; Estrada, Juan; Etzion, Erez; Fernández Moroni, Guillermo
; Gift, Daniel; Holland, Stephen E.; Munagavalasa, Sravan; Orly, Aviv; Rodrigues Ferreira Maltez, Dario Pablo
; Singal, Aman; Sofo Haro, Miguel Francisco
; Stefanazzi, Leandro
; Tiffenberg, Javier Sebastian
; Uemura, Sho; Volansky, Tomer; Yu, Tien Tien
Fecha de publicación:
01/2022
Editorial:
American Physical Society
Revista:
Physical Review Applied
ISSN:
2331-7019
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We use a science-grade skipper charge-coupled device (skipper CCD) operating in a low-radiation background environment to develop a semiempirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as "dark counts": dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89±0.77)×10-4e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52±0.07)×10-4e-/pix, which is exposure independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detector's operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing research and development efforts of skipper and conventional CCDs.
Palabras clave:
sensei
,
single-electron
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Articulos(IIIE)
Articulos de INST.DE INVEST.EN ING.ELECTRICA "A.DESAGES"
Articulos de INST.DE INVEST.EN ING.ELECTRICA "A.DESAGES"
Citación
Barak, Liron; Bloch, Itay M.; Botti, Ana Martina; Cababie, Mariano Ruben; Cancelo, Gustavo Indalecio; et al.; SENSEI: Characterization of Single-Electron Events Using a Skipper Charge-Coupled Device; American Physical Society; Physical Review Applied; 17; 1; 1-2022; 1-9
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