Mostrar el registro sencillo del ítem

dc.contributor.author
Messina, Francisco Javier  
dc.contributor.author
Marchi, Pablo Gabriel  
dc.contributor.author
Rey Vega, Leonardo Javier  
dc.contributor.author
Galarza, Cecilia Gabriela  
dc.date.available
2023-06-15T14:54:55Z  
dc.date.issued
2018  
dc.identifier.citation
On steady-state model uncertainty in phasor estimation: A robust statistical approach; IEEE International Instrumentation and Measurement Technology Conference; Houston; Estados Unidos; 2018; 1-6  
dc.identifier.uri
http://hdl.handle.net/11336/200745  
dc.description.abstract
The poor performance of the DFT phasor estimator in off-nominal frequency scenarios is very well-known in the synchrophasor estimation literature. Similar effects are observed dueto harmonics, interharmonics, and negative-sequence unbalances in three-phase signals. It is shown that all these issues are adirect consequence of a model mismatch between an underlying statistical model and the actual signal. In order to cope with this model uncertainty, a robust phasor estimator (RPE) is proposed.It is obtained by minimizing the worst-case mean squared total vector error (MSTVE), a novel metric which generalizes the TVE to account not only for the estimator bias due to the model mismatch but also for the estimator variance due to noise. Numerical results show that a significant improvement in performance can be obtained with respect to the classical DFT and WDFT phasor estimators. Finally, an RPE design example is given, illustrating the flexibility and advantages of the robust statistical approach.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/restrictedAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
PHASOR  
dc.subject
ROBUST ESTIMATION  
dc.subject
UNCERTAINTY  
dc.subject
PMU  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
On steady-state model uncertainty in phasor estimation: A robust statistical approach  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.type
info:eu-repo/semantics/conferenceObject  
dc.type
info:ar-repo/semantics/documento de conferencia  
dc.date.updated
2023-06-07T22:41:32Z  
dc.journal.pagination
1-6  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Houston  
dc.description.fil
Fil: Messina, Francisco Javier. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Electronica; Argentina  
dc.description.fil
Fil: Marchi, Pablo Gabriel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina  
dc.description.fil
Fil: Rey Vega, Leonardo Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Electronica; Argentina  
dc.description.fil
Fil: Galarza, Cecilia Gabriela. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/8409734  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/I2MTC.2018.8409734  
dc.conicet.rol
Autor  
dc.conicet.rol
Autor  
dc.conicet.rol
Autor  
dc.conicet.rol
Autor  
dc.coverage
Internacional  
dc.type.subtype
Conferencia  
dc.description.nombreEvento
IEEE International Instrumentation and Measurement Technology Conference  
dc.date.evento
2018-05-14  
dc.description.ciudadEvento
Houston  
dc.description.paisEvento
Estados Unidos  
dc.type.publicacion
Book  
dc.description.institucionOrganizadora
Institute of Electrical and Electronics Engineers  
dc.source.libro
IEEE International Instrumentation and Measurement Technology Conference  
dc.date.eventoHasta
2018-05-17  
dc.type
Conferencia