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dc.contributor.author
Messina, Francisco Javier
dc.contributor.author
Marchi, Pablo Gabriel
dc.contributor.author
Rey Vega, Leonardo Javier
dc.contributor.author
Galarza, Cecilia Gabriela
dc.date.available
2023-06-15T14:54:55Z
dc.date.issued
2018
dc.identifier.citation
On steady-state model uncertainty in phasor estimation: A robust statistical approach; IEEE International Instrumentation and Measurement Technology Conference; Houston; Estados Unidos; 2018; 1-6
dc.identifier.uri
http://hdl.handle.net/11336/200745
dc.description.abstract
The poor performance of the DFT phasor estimator in off-nominal frequency scenarios is very well-known in the synchrophasor estimation literature. Similar effects are observed dueto harmonics, interharmonics, and negative-sequence unbalances in three-phase signals. It is shown that all these issues are adirect consequence of a model mismatch between an underlying statistical model and the actual signal. In order to cope with this model uncertainty, a robust phasor estimator (RPE) is proposed.It is obtained by minimizing the worst-case mean squared total vector error (MSTVE), a novel metric which generalizes the TVE to account not only for the estimator bias due to the model mismatch but also for the estimator variance due to noise. Numerical results show that a significant improvement in performance can be obtained with respect to the classical DFT and WDFT phasor estimators. Finally, an RPE design example is given, illustrating the flexibility and advantages of the robust statistical approach.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
PHASOR
dc.subject
ROBUST ESTIMATION
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UNCERTAINTY
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PMU
dc.subject.classification
Ingeniería Eléctrica y Electrónica
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
On steady-state model uncertainty in phasor estimation: A robust statistical approach
dc.type
info:eu-repo/semantics/publishedVersion
dc.type
info:eu-repo/semantics/conferenceObject
dc.type
info:ar-repo/semantics/documento de conferencia
dc.date.updated
2023-06-07T22:41:32Z
dc.journal.pagination
1-6
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Houston
dc.description.fil
Fil: Messina, Francisco Javier. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Electronica; Argentina
dc.description.fil
Fil: Marchi, Pablo Gabriel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina
dc.description.fil
Fil: Rey Vega, Leonardo Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Electronica; Argentina
dc.description.fil
Fil: Galarza, Cecilia Gabriela. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Parque Centenario. Centro de Simulación Computacional para Aplicaciones Tecnológicas; Argentina
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/8409734
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/I2MTC.2018.8409734
dc.conicet.rol
Autor
dc.conicet.rol
Autor
dc.conicet.rol
Autor
dc.conicet.rol
Autor
dc.coverage
Internacional
dc.type.subtype
Conferencia
dc.description.nombreEvento
IEEE International Instrumentation and Measurement Technology Conference
dc.date.evento
2018-05-14
dc.description.ciudadEvento
Houston
dc.description.paisEvento
Estados Unidos
dc.type.publicacion
Book
dc.description.institucionOrganizadora
Institute of Electrical and Electronics Engineers
dc.source.libro
IEEE International Instrumentation and Measurement Technology Conference
dc.date.eventoHasta
2018-05-17
dc.type
Conferencia
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