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dc.contributor.author
Lipovetzky, José  
dc.contributor.author
Holmes Siedle, A.  
dc.contributor.author
García Inza, Mariano Andrés  
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Carbonetto, Sebastián Horacio  
dc.contributor.author
Redin, Eduardo Gabriel  
dc.contributor.author
Faigon, A.  
dc.date.available
2023-06-06T14:48:48Z  
dc.date.issued
2012-12  
dc.identifier.citation
Lipovetzky, José; Holmes Siedle, A.; García Inza, Mariano Andrés; Carbonetto, Sebastián Horacio; Redin, Eduardo Gabriel; et al.; New fowler-nordheim injection, charge neutralization, and gamma tests on the REM RFT300 RADFET dosimeter; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 6; 12-2012; 3133-3140  
dc.identifier.issn
0018-9499  
dc.identifier.uri
http://hdl.handle.net/11336/199736  
dc.description.abstract
Through the injection of a Fowler-Nordheim tunnel current or the inversion of oxide fields during irradiation (Radiation-Induced Charge Neutralization), the oxide charge trapped in thick-oxide (300 nm) commercial RADFETs, often called QOT could be erased. Novel trapped-hole and interface characteristics were observed after treatments of this type at high doses. With both erasure techniques, it was possible only to neutralize a fraction of the oxide trapped charge. A non negligible amount of charge and border traps is deemed here to be ?intractable?. That adjective an a symbol, QIN, are introduced for the first time in this paper. Later sections discuss the possible impact of these results. The conclusion for dosimetry is that a ?reusable RADFET? dosimeter, working up to an unprecedented dose before wearing out, may be a practical possibility.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
BIAS-CONTROLLED CYCLED MEASUREMENTS  
dc.subject
DOSIMETERS  
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FOWLER-NORDHEIM TUNNEL INJECTION  
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MOS DEVICES  
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RADFET  
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RADIATION EFFECTS  
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REM RFT300  
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SOLID-STATE DETECTORS  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
New fowler-nordheim injection, charge neutralization, and gamma tests on the REM RFT300 RADFET dosimeter  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2023-06-06T12:39:15Z  
dc.journal.volume
59  
dc.journal.number
6  
dc.journal.pagination
3133-3140  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
New York  
dc.description.fil
Fil: Lipovetzky, José. Universidad de Buenos Aires. Facultad de Ingeniería; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Holmes Siedle, A.. No especifíca;  
dc.description.fil
Fil: García Inza, Mariano Andrés. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires; Argentina  
dc.description.fil
Fil: Carbonetto, Sebastián Horacio. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Redin, Eduardo Gabriel. Universidad de Buenos Aires; Argentina  
dc.description.fil
Fil: Faigon, A.. Universidad de Buenos Aires; Argentina  
dc.journal.title
Ieee Transactions on Nuclear Science  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TNS.2012.2222667