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dc.contributor.author
Spinelli, Enrique Mario  
dc.contributor.author
Haberman, Marcelo Alejandro  
dc.date.available
2023-05-02T12:37:12Z  
dc.date.issued
2012-06  
dc.identifier.citation
Spinelli, Enrique Mario; Haberman, Marcelo Alejandro; Noise analysis of fully differential circuits; Institute of Electrical and Electronics Engineers; IEEE Latin America Transactions; 10; 4; 6-2012; 1889-1892  
dc.identifier.issn
1548-0992  
dc.identifier.uri
http://hdl.handle.net/11336/195929  
dc.description.abstract
Fully-Differential (F-D) circuits are widely used because of its immunity to common mode interference and high dynamic range, being well suited for battery-powered devices. The analysis and design of this circuits call for specific techniques; this paper presents a method to estimate the output noise of F-D circuits due to its components. An example and also experimental data are included. © 2012 IEEE.  
dc.format
application/pdf  
dc.language.iso
spa  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
FULLY-DIFFERENTIAL CIRCUITS  
dc.subject
NOISE ANALYSIS  
dc.subject
SYMMETRICAL NETWORKS  
dc.subject.classification
Otras Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Noise analysis of fully differential circuits  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2023-04-19T17:26:09Z  
dc.journal.volume
10  
dc.journal.number
4  
dc.journal.pagination
1889-1892  
dc.journal.pais
Brasil  
dc.description.fil
Fil: Spinelli, Enrique Mario. Universidad Nacional de La Plata; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Haberman, Marcelo Alejandro. Universidad Nacional de La Plata; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
IEEE Latin America Transactions  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TLA.2012.6272470  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6272470  

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