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dc.contributor.author
Kim, Jeehoon  
dc.contributor.author
Civale, L.  
dc.contributor.author
Nazaretski, E.  
dc.contributor.author
Haberkorn, Nestor Fabian  
dc.contributor.author
Ronning, F.  
dc.contributor.author
Sefat, A. S.  
dc.contributor.author
Tajima, T.  
dc.contributor.author
Moeckly, B. H.  
dc.contributor.author
Thompson, J. D.  
dc.contributor.author
Movshovich, R.  
dc.date.available
2023-04-24T18:10:12Z  
dc.date.issued
2012-09  
dc.identifier.citation
Kim, Jeehoon; Civale, L.; Nazaretski, E.; Haberkorn, Nestor Fabian; Ronning, F.; et al.; Direct measurement of the magnetic penetration depth by magnetic force microscopy; IOP Publishing; Superconductor Science And Technology; 25; 11; 9-2012; 112001-112007  
dc.identifier.issn
0953-2048  
dc.identifier.uri
http://hdl.handle.net/11336/195186  
dc.description.abstract
We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth (lambda) in superconductors. Lambda is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured on a reference sample. Using a well characterized Nb film as a reference, we determine the absolute value of lambda in a Ba(Fe0.92Co0.08)2As2 single crystal and a MgB2 thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of lambda in superconducting thin film or single crystal samples.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
IODIDE  
dc.subject
IODOLIPIDS  
dc.subject
THYROID CELL REGULATION  
dc.subject
THYROID FOLLICLES (BOVINE)  
dc.subject.classification
Física de los Materiales Condensados  
dc.subject.classification
Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Direct measurement of the magnetic penetration depth by magnetic force microscopy  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2023-03-20T14:59:40Z  
dc.journal.volume
25  
dc.journal.number
11  
dc.journal.pagination
112001-112007  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Kim, Jeehoon. No especifíca;  
dc.description.fil
Fil: Civale, L.. No especifíca;  
dc.description.fil
Fil: Nazaretski, E.. No especifíca;  
dc.description.fil
Fil: Haberkorn, Nestor Fabian. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina  
dc.description.fil
Fil: Ronning, F.. No especifíca;  
dc.description.fil
Fil: Sefat, A. S.. No especifíca;  
dc.description.fil
Fil: Tajima, T.. No especifíca;  
dc.description.fil
Fil: Moeckly, B. H.. No especifíca;  
dc.description.fil
Fil: Thompson, J. D.. No especifíca;  
dc.description.fil
Fil: Movshovich, R.. No especifíca;  
dc.journal.title
Superconductor Science And Technology  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/0953-2048/25/11/112001/meta  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/0953-2048/25/11/112001