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dc.contributor.author
Kim, Jeehoon
dc.contributor.author
Civale, L.
dc.contributor.author
Nazaretski, E.
dc.contributor.author
Haberkorn, Nestor Fabian
dc.contributor.author
Ronning, F.
dc.contributor.author
Sefat, A. S.
dc.contributor.author
Tajima, T.
dc.contributor.author
Moeckly, B. H.
dc.contributor.author
Thompson, J. D.
dc.contributor.author
Movshovich, R.
dc.date.available
2023-04-24T18:10:12Z
dc.date.issued
2012-09
dc.identifier.citation
Kim, Jeehoon; Civale, L.; Nazaretski, E.; Haberkorn, Nestor Fabian; Ronning, F.; et al.; Direct measurement of the magnetic penetration depth by magnetic force microscopy; IOP Publishing; Superconductor Science And Technology; 25; 11; 9-2012; 112001-112007
dc.identifier.issn
0953-2048
dc.identifier.uri
http://hdl.handle.net/11336/195186
dc.description.abstract
We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth (lambda) in superconductors. Lambda is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured on a reference sample. Using a well characterized Nb film as a reference, we determine the absolute value of lambda in a Ba(Fe0.92Co0.08)2As2 single crystal and a MgB2 thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of lambda in superconducting thin film or single crystal samples.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
IOP Publishing
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
IODIDE
dc.subject
IODOLIPIDS
dc.subject
THYROID CELL REGULATION
dc.subject
THYROID FOLLICLES (BOVINE)
dc.subject.classification
Física de los Materiales Condensados
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Direct measurement of the magnetic penetration depth by magnetic force microscopy
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2023-03-20T14:59:40Z
dc.journal.volume
25
dc.journal.number
11
dc.journal.pagination
112001-112007
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Kim, Jeehoon. No especifíca;
dc.description.fil
Fil: Civale, L.. No especifíca;
dc.description.fil
Fil: Nazaretski, E.. No especifíca;
dc.description.fil
Fil: Haberkorn, Nestor Fabian. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina
dc.description.fil
Fil: Ronning, F.. No especifíca;
dc.description.fil
Fil: Sefat, A. S.. No especifíca;
dc.description.fil
Fil: Tajima, T.. No especifíca;
dc.description.fil
Fil: Moeckly, B. H.. No especifíca;
dc.description.fil
Fil: Thompson, J. D.. No especifíca;
dc.description.fil
Fil: Movshovich, R.. No especifíca;
dc.journal.title
Superconductor Science And Technology
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/0953-2048/25/11/112001/meta
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/0953-2048/25/11/112001
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