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dc.contributor.author
Benfica, Juliano  
dc.contributor.author
Bolzani Poehls, Letícia Maria  
dc.contributor.author
Vargas, Fabian  
dc.contributor.author
Lipovetzky, José  
dc.contributor.author
Lutenberg, Ariel  
dc.contributor.author
Gatti, Edmundo  
dc.contributor.author
Hernandez, Fernando  
dc.date.available
2023-03-30T14:29:21Z  
dc.date.issued
2012-12  
dc.identifier.citation
Benfica, Juliano; Bolzani Poehls, Letícia Maria; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; A test platform for dependability analysis of SoCs Exposed to EMI and radiation; Springer; Journal Of Electronic Testing: Theory And Applications; 28; 6; 12-2012; 803-816  
dc.identifier.issn
0923-8174  
dc.identifier.uri
http://hdl.handle.net/11336/192163  
dc.description.abstract
With the IEC 62.132 proposal, the roadmap for standardization of Electromagnetic (EM) immunity measurement methods has reached a high degree of success. The same understanding can be taken from the MIL-STD-883 H for Total Ionizing Dose (TID) radiation. However, no effort has been made to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For the reasons pointed out, the combined-effect measurements should be mandatory when dealing with Systems-on-Chip (SoCs) devoted to critical applications. In this paper, we present a configurable platform devoted to perform combined tests of EM immunity and TID radiation of SoCs according to the international standards.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Springer  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
ELECTROMAGNETIC INTERFERENCE  
dc.subject
SYSTEM-ON-CHIP  
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TESTING PLATFORM  
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TOTAL-IONIZING DOSE RADIATION  
dc.subject.classification
Hardware y Arquitectura de Computadoras  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
A test platform for dependability analysis of SoCs Exposed to EMI and radiation  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2023-03-29T17:18:35Z  
dc.journal.volume
28  
dc.journal.number
6  
dc.journal.pagination
803-816  
dc.journal.pais
Alemania  
dc.journal.ciudad
Berlin  
dc.description.fil
Fil: Benfica, Juliano. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Bolzani Poehls, Letícia Maria. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Vargas, Fabian. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Lipovetzky, José. Universidad de Buenos Aires. Facultad de Ingeniería; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Lutenberg, Ariel. Universidad de Buenos Aires. Facultad de Ingeniería; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Gatti, Edmundo. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina  
dc.description.fil
Fil: Hernandez, Fernando. Universidad ORT Uruguay; Uruguay  
dc.journal.title
Journal Of Electronic Testing: Theory And Applications  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://link.springer.com/article/10.1007%2Fs10836-012-5334-z  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1007/s10836-012-5334-z  

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