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dc.contributor.author
Domené, Esteban Alejo
dc.contributor.author
Martínez, Oscar E.
dc.date.available
2017-06-28T21:44:33Z
dc.date.issued
2013-01
dc.identifier.citation
Domené, Esteban Alejo; Martínez, Oscar E.; Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM); American Institute of Physics; Review of Scientific Instruments; 84; 1; 1-2013; 1-3; 016104
dc.identifier.issn
0034-6748
dc.identifier.uri
http://hdl.handle.net/11336/19097
dc.description.abstract
An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
American Institute of Physics
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Fototérmica
dc.subject
Difusividad Térmica
dc.subject.classification
Otras Ciencias Físicas
dc.subject.classification
Ciencias Físicas
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS
dc.title
Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-06-28T15:02:43Z
dc.journal.volume
84
dc.journal.number
1
dc.journal.pagination
1-3; 016104
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Nueva York
dc.description.fil
Fil: Domené, Esteban Alejo. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Electrónica Cuántica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Martínez, Oscar E.. Empresa Tolket Srl; Argentina
dc.journal.title
Review of Scientific Instruments
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4774111
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4774111
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