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dc.contributor.author
Domené, Esteban Alejo  
dc.contributor.author
Martínez, Oscar E.  
dc.date.available
2017-06-28T21:44:33Z  
dc.date.issued
2013-01  
dc.identifier.citation
Domené, Esteban Alejo; Martínez, Oscar E.; Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM); American Institute of Physics; Review of Scientific Instruments; 84; 1; 1-2013; 1-3; 016104  
dc.identifier.issn
0034-6748  
dc.identifier.uri
http://hdl.handle.net/11336/19097  
dc.description.abstract
An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm).  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Fototérmica  
dc.subject
Difusividad Térmica  
dc.subject.classification
Otras Ciencias Físicas  
dc.subject.classification
Ciencias Físicas  
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS  
dc.title
Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-06-28T15:02:43Z  
dc.journal.volume
84  
dc.journal.number
1  
dc.journal.pagination
1-3; 016104  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Nueva York  
dc.description.fil
Fil: Domené, Esteban Alejo. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Electrónica Cuántica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Martínez, Oscar E.. Empresa Tolket Srl; Argentina  
dc.journal.title
Review of Scientific Instruments  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4774111  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4774111