Mostrar el registro sencillo del ítem

dc.contributor.author
Divan, Ralu  
dc.contributor.author
Rosenthal, Dan  
dc.contributor.author
Ogando, Karim  
dc.contributor.author
Ocola, Leonidas E.  
dc.contributor.author
Rosenmann, Daniel  
dc.contributor.author
Moldovan, Nicolaie  
dc.date.available
2022-12-12T12:51:33Z  
dc.date.issued
2013-11  
dc.identifier.citation
Divan, Ralu; Rosenthal, Dan; Ogando, Karim; Ocola, Leonidas E.; Rosenmann, Daniel; et al.; Metal-assisted etching of silicon molds for electroforming; A V S Amer Inst Physics; Journal Of Vacuum Science & Technology B; 31; 6; 11-2013; 1-7  
dc.identifier.issn
0734-211X  
dc.identifier.uri
http://hdl.handle.net/11336/180705  
dc.description.abstract
Ordered arrays of high-aspect-ratio micro/nanostructures in semiconductors stirred a huge scientific interest due to their unique one-dimensional physical morphology and the associated electrical, mechanical, chemical, optoelectronic, and thermal properties. Metal-assisted chemical etching enables fabrication of such high aspect ratio Si nanostructures with controlled diameter, shape, length, and packing density, but suffers from structure deformation and shape inconsistency due to uncontrolled migration of noble metal structures during etching. Hereby the authors prove that a Ti adhesion layer helps in stabilizing gold structures, preventing their migration on the wafer surface while not impeding the etching. Based on this finding, the authors demonstrate that the method can be used to fabricate linear Fresnel zone plates.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
A V S Amer Inst Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Nanofabrication  
dc.subject
Electroplating  
dc.subject
Etching  
dc.subject
Gold  
dc.subject.classification
Nano-materiales  
dc.subject.classification
Nanotecnología  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Metal-assisted etching of silicon molds for electroforming  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2022-12-07T17:51:37Z  
dc.identifier.eissn
1071-1023  
dc.journal.volume
31  
dc.journal.number
6  
dc.journal.pagination
1-7  
dc.journal.pais
Estados Unidos  
dc.description.fil
Fil: Divan, Ralu. Argonne National Laboratory; Estados Unidos  
dc.description.fil
Fil: Rosenthal, Dan. Illinois Mathematics and Science Academy; Estados Unidos  
dc.description.fil
Fil: Ogando, Karim. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Area de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche). División Bajas Temperaturas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina  
dc.description.fil
Fil: Ocola, Leonidas E.. Argonne National Laboratory; Estados Unidos  
dc.description.fil
Fil: Rosenmann, Daniel. Argonne National Laboratory; Estados Unidos  
dc.description.fil
Fil: Moldovan, Nicolaie. Argonne National Laboratory; Estados Unidos. Advanced Diamond Technologies; Estados Unidos  
dc.journal.title
Journal Of Vacuum Science & Technology B  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1116/1.4821651  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://avs.scitation.org/doi/10.1116/1.4821651