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dc.contributor.author
Bierzychudek, Marcos Eduardo  
dc.contributor.author
Götz, Martin  
dc.contributor.author
Sanchez Peña, Ricardo Salvador  
dc.contributor.author
Iuzzolino, Ricardo Javier  
dc.contributor.author
Drung, Dietmar  
dc.date.available
2022-11-23T15:07:51Z  
dc.date.issued
2017-01  
dc.identifier.citation
Bierzychudek, Marcos Eduardo; Götz, Martin; Sanchez Peña, Ricardo Salvador; Iuzzolino, Ricardo Javier; Drung, Dietmar; Application of Robust Control to a Cryogenic Current Comparator; Institute of Electrical and Electronics Engineers; Ieee Transactions on Instrumentation and Measurement; 66; 6; 1-2017; 1095-1102  
dc.identifier.issn
0018-9456  
dc.identifier.uri
http://hdl.handle.net/11336/178699  
dc.description.abstract
This paper describes the implementation of a digital robust controller in a cryogenic current comparator. The controller was designed applying H∞ control theory and it was programmed in a home-made digital unit. Experimental comparisons of the new robust controller with the conventional analog integrator have showed a significant improvement of stability robustness and noise rejection in the system.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
CURRENT COMPARATOR  
dc.subject
H∞ CONTROL  
dc.subject
METROLOGY  
dc.subject
RESISTANCE MEASUREMENT  
dc.subject
SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE (SQUID)  
dc.subject.classification
Sistemas de Automatización y Control  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Application of Robust Control to a Cryogenic Current Comparator  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2022-11-22T09:13:09Z  
dc.journal.volume
66  
dc.journal.number
6  
dc.journal.pagination
1095-1102  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
New York  
dc.description.fil
Fil: Bierzychudek, Marcos Eduardo. Instituto Tecnológico de Buenos Aires; Argentina. Instituto Nacional de Tecnología Industrial; Argentina  
dc.description.fil
Fil: Götz, Martin. Physikalisch-technische Bundesanstalt; Alemania  
dc.description.fil
Fil: Sanchez Peña, Ricardo Salvador. Instituto Tecnológico de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Iuzzolino, Ricardo Javier. Instituto Nacional de Tecnología Industrial; Argentina  
dc.description.fil
Fil: Drung, Dietmar. Physikalisch-Technische Bundesanstalt; Alemania  
dc.journal.title
Ieee Transactions on Instrumentation and Measurement  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TIM.2017.2648898