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Artículo

Genome-wide association mapping of genetic factors controlling Septoria tritici blotch resistance and their associations with plant height and heading date in wheat

Gerard, Guillermo SebastiánIcon ; Börner, Andreas; Lohwasser, Ulrike; Simon, Maria RosaIcon
Fecha de publicación: 01/2017
Editorial: Springer
Revista: Euphytica
ISSN: 0014-2336
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Agronomía, reproducción y protección de plantas

Resumen

Septoria tritici blotch (STB), caused by the ascomycete fungus Zymoseptoria tritici (also known as Mycosphaerella graminicola), is one of the most devastating foliar wheat diseases worldwide. Host resistance is the most effective strategy for management of the disease. A factor that complicates the determination of resistance is its reported interaction with heading date (Hd) and plant height (Ph). In this study, we report findings from a genome-wide association study of resistance to STB in a world-wide collection of 96 wheat accessions. The collection was evaluated under conditions of artificial infection for seedling and adult plant STB resistance, Hd and Ph in field trials. Marker-trait associations (MTAs) were detected using a mixed linear model. STB disease severities showed significant phenotypic variation. In total, 73 MTAs involving STB resistance were detected. The chromosomal locations of some of them were similar to known Stb genes or quantitative trait loci; whereas others were detected in new genomic regions. The field experiment showed evidence of genetic association between STB resistance and Hd, but only for a few genotypes. This was corroborated at the molecular level, where a total of eight genomic regions associated with STB resistance were located in similar positions to MTAs for Hd. New genomic regions associated with STB resistance found here could be useful in wheat breeding aimed at controlling STB after validation in relevant genetic backgrounds.
Palabras clave: DART , TRITICUM AESTIVUM , ZYMOSEPTORIA TRITICI
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/178442
URL: https://link.springer.com/article/10.1007/s10681-016-1820-1
DOI: http://dx.doi.org/10.1007/s10681-016-1820-1
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Articulos(CCT - LA PLATA)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - LA PLATA
Citación
Gerard, Guillermo Sebastián; Börner, Andreas; Lohwasser, Ulrike; Simon, Maria Rosa; Genome-wide association mapping of genetic factors controlling Septoria tritici blotch resistance and their associations with plant height and heading date in wheat; Springer; Euphytica; 213; 1; 1-2017; 27-43
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