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dc.contributor.author
Tarpau, Cecilia
dc.contributor.author
Cebeiro, Javier
dc.contributor.author
Nguyen, Mai K.
dc.date.available
2022-06-22T17:36:18Z
dc.date.issued
2020
dc.identifier.citation
A new bi-imaging NDT system for simultaneous recovery of attenuation and electronic density maps; 11th International Symposium on Non-Destructive Testing and Evaluation in Aerospace; Paris; Francia; 2019; 1-10
dc.identifier.issn
1435-4934
dc.identifier.uri
http://hdl.handle.net/11336/160243
dc.description.abstract
Computed Tomography is a widely used imaging technique for non-destructive testing and evaluation in industry. Tomographic modalities exploit only primary radiation, which is non-deviated but attenuated radiation going through matter. However, in the energy range of X and gamma rays used in non destructive testing, Compton effect is an important physical phenomenon which should be taken into account. Compton Scattering Tomography is precisely theimaging technique, which not only accounts for the Compton effect but also uses it to image material electronic density. This paper proposes the concept of a Compton scanner,which is formed by a source and several detectors placed on a circular ring. When the detectors are set to register the energy of primary photons, the system works as Fan-Beam computed tomography scanner. But if the detectors are set to register the energy of scattered photons, the system operates as Compton scattering tomography scanner. Such a device, that we called a bi-imaging system provides both the attenuation map and the electronic density of the scanned object. Both information from primary and scattered rays is then wisely exploited. The mathematical modelling of this system makes use of a Radon transform on circular arcs. Numerical simulations are carried out in order to illustrate the theoretical feasibility of the proposed system.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Confédération Française pour les Essais Non Destructifs
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
NON-DESTRUCTIVE TESTING
dc.subject
RADON TYPE TRANSFORMS
dc.subject
FAN-BEAM COMPUTED TOMOGRAPHY (FBCT)
dc.subject
COMPTON SCATTERING TOMOGRAPHY
dc.subject
BI-IMAGING
dc.subject
ELECTRONIC DENSITY
dc.subject
ATTENUATION MAP
dc.subject.classification
Matemática Aplicada
dc.subject.classification
Matemáticas
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS
dc.title
A new bi-imaging NDT system for simultaneous recovery of attenuation and electronic density maps
dc.type
info:eu-repo/semantics/publishedVersion
dc.type
info:eu-repo/semantics/conferenceObject
dc.type
info:ar-repo/semantics/documento de conferencia
dc.date.updated
2022-06-21T18:16:54Z
dc.journal.volume
25
dc.journal.number
2
dc.journal.pagination
1-10
dc.journal.pais
Francia
dc.journal.ciudad
Paris
dc.description.fil
Fil: Tarpau, Cecilia. Cergy-paris Universite (cergy-paris Universite); Francia. Université de Versailles Saint-quentin-en-yvelines.; Francia
dc.description.fil
Fil: Cebeiro, Javier. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de San Martin. Escuela de Ciencia y Tecnología. Centro de Matemática Aplicada; Argentina
dc.description.fil
Fil: Nguyen, Mai K.. Cergy-paris Universite (cergy-paris Universite); Francia
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.ndt.net/search/docs.php3?id=25060
dc.conicet.rol
Autor
dc.conicet.rol
Autor
dc.conicet.rol
Autor
dc.coverage
Internacional
dc.type.subtype
Simposio
dc.description.nombreEvento
11th International Symposium on Non-Destructive Testing and Evaluation in Aerospace
dc.date.evento
2019-11-19
dc.description.ciudadEvento
Paris
dc.description.paisEvento
Francia
dc.type.publicacion
Journal
dc.description.institucionOrganizadora
Confédération Française pour les Essais Non Destructifs
dc.source.libro
Proceedings of the 11th International Symposium on Non-Destructive Testing and Evaluation in aerospace
dc.source.revista
e-Journal of Nondestructive Testing
dc.type
Simposio
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