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dc.contributor.author
Bava, Jose Alberto

dc.contributor.author
Laquidara, Anibal Pablo

dc.contributor.author
Bava, Jose Alberto

dc.contributor.author
Garavaglia, Mario Jose

dc.date.available
2022-04-26T19:09:45Z
dc.date.issued
2008-04-01
dc.identifier.citation
Bava, Jose Alberto; Laquidara, Anibal Pablo; Bava, Jose Alberto; Garavaglia, Mario Jose; Telemetrology by processing digital moiré patterns; Society of Photo-Optical Instrumentation Engineers; Optical Engineering; 47; 4; 01-4-2008
dc.identifier.issn
0091-3286
dc.identifier.uri
http://hdl.handle.net/11336/155813
dc.description.abstract
Operations with hidden optoelectronic grid patterns for measuring distances from a camera to an object were described in recent papers. In this paper, the possibility of performing metrological teleoperations with digital moiré patterns processing is discussed. We introduce two new processes: (1) instead of using hidden grids as in previous works, we digitally apply contrasted Ronchi grids to the images by an AND operation; (2) the process is related to the generation of moiré fringes. We perform this operation at two slightly different camera-object distances where the camera displacement ∆L is known. By using this method it is possible to measure both the object dimensions and the distance between the object and camera in the same operation. In a previous paper a relative uncertainty of less than 10% for a distance of 40 m from a photographic analogue camera to an object was reported. In the experimental laboratory demonstration presented in this paper using our method of digital moiré pattern processing, it was possible to reduce the uncertainty to 1.2% for a camera-object distance of 2 m and to 4% for 12 m, using an object dimension of 30 cm. Experimental results for several camera positions are presented along with sources of uncertainties. We also present concluding remarks and prospects for future work.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Society of Photo-Optical Instrumentation Engineers

dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
TELEMETROLOGY
dc.subject
MOIRE
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones

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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información

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INGENIERÍAS Y TECNOLOGÍAS

dc.title
Telemetrology by processing digital moiré patterns
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2021-12-03T19:51:43Z
dc.journal.volume
47
dc.journal.number
4
dc.journal.pais
Estados Unidos

dc.description.fil
Fil: Bava, Jose Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
dc.description.fil
Fil: Laquidara, Anibal Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
dc.description.fil
Fil: Bava, Jose Alberto. Universidad Politécnica de Valencia; España. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Garavaglia, Mario Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
dc.journal.title
Optical Engineering

dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.spiedigitallibrary.org/journals/optical-engineering/volume-47/issue-4/043603/Telemetrology-by-processing-digital-moir%c3%a9-patterns/10.1117/1.2911717.short?SSO=1
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1117/1.2911717
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