Artículo
FIB analysis of fossils plant remains: Technical and experimental aspects
Benedetti, Alessandro; Sender Palomar, Luis Miguel; Escapa, Ignacio Hernán
; Cúneo, Rubén; Diez, José Bienvenido
Fecha de publicación:
11/2018
Editorial:
Akadémiai Kiadó
Revista:
Resolution and Discovery
e-ISSN:
2498-8707
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We present a comprehensive study about the technical aspects of the application of focused ion beam (FIB) to thestudy of cuticles and compressions of fossil leaves.The technique allowed us to cross section and image fossil coalified plant remains with a spatial resolution withinthe 10 nm range, far higher than any other method employed so far.At various stages of the milling process, we observed significant gallium redeposition on the trench walls, particularly pronounced in the case of cavities. These highly unwanted artefacts can be greatly reduced, but not wholly eliminated, by lowering either or both the beam current and acceleration voltage; nevertheless, great care is needed when interpreting cross-sectional images.
Palabras clave:
FIB
,
SEM
,
FOSSIL PLANT CUTICLES
,
MICROSTRUCTURES
,
MILLING DAMAGE
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Articulos de SEDE CENTRAL
Citación
Benedetti, Alessandro; Sender Palomar, Luis Miguel; Escapa, Ignacio Hernán; Cúneo, Rubén; Diez, José Bienvenido; FIB analysis of fossils plant remains: Technical and experimental aspects; Akadémiai Kiadó; Resolution and Discovery; 3; 1; 11-2018; 2-4
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