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dc.contributor.author
Bilovol, Vitaliy
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Pampillo, Laura G.
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Meier, Dagmar
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Wolff, Ulrike
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Saccone, Fabio Daniel
dc.date.available
2017-04-05T18:26:59Z
dc.date.issued
2014-06
dc.identifier.citation
Bilovol, Vitaliy; Pampillo, Laura G.; Meier, Dagmar; Wolff, Ulrike; Saccone, Fabio Daniel; Cobalt ferrite films: nano-polishing and magnetic properties; Institute of Electrical and Electronics Engineers; IEEE Transactions on Magnetics; 50; 9; 6-2014; 1-5
dc.identifier.issn
0018-9464
dc.identifier.uri
http://hdl.handle.net/11336/14851
dc.description.abstract
CoFe2O4 films were deposited on Si [(100) or (111)] substrates by pulsed laser deposition, varying substrate temperature and deposition time. All films showed highly (111)-preferred orientation. Magnetic measurements (hysteresis loops) at room temperature indicated that the films have in-plane magnetic anisotropy. By atomic force microscopy, the surface topology revealed an average roughness of approximately 15 nm due to the presence of droplets. To define the relevance of droplets on the films' magnetic properties, we applied a nanopolishing technique after which the surfaces became notoriously smoother. As a consequence of this surface modification, we found that the hysteresis loops (measured again after nanopolishing) revealed changes in the magnetic response of the samples. The thinner films ((t ~50) nm) revealed waist-type hysteresis loops with diminished values of the coercive field, while the thickest film ((t ~100) nm) increased its coercive field without qualitative change in its loop shape. We attributed the altered magnetic response to different mechanisms that depend on sample thickness. For the thinner films, an additional anisotropy (to that existing in the plane) was induced after the nanopolishing procedure. For the thickest film, it was observed that differences are present after the elimination of the droplets, showing their important role in the magnetic response of the films.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Magnetic Hysteresis
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Magnetic Films
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Perpendicular Magnetic Anisotropy
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Substrates
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Silicon
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Recubrimientos y Películas
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Ingeniería de los Materiales
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Cobalt ferrite films: nano-polishing and magnetic properties
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-04-03T17:30:20Z
dc.identifier.eissn
1941-0069
dc.journal.volume
50
dc.journal.number
9
dc.journal.pagination
1-5
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Nueva York
dc.description.fil
Fil: Bilovol, Vitaliy. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
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Fil: Pampillo, Laura G.. Leibniz-Institut für Festkörper-und Werkstoffforschung Dresden; Alemania
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Fil: Meier, Dagmar. Leibniz-Institut für Festkörper-und Werkstoffforschung Dresden; Alemania
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Fil: Wolff, Ulrike. Leibniz-Institut für Festkörper-und Werkstoffforschung Dresden; Alemania
dc.description.fil
Fil: Saccone, Fabio Daniel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
dc.journal.title
IEEE Transactions on Magnetics
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/6787010/?arnumber=6787010
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://dx.doi.org/10.1109/TMAG.2014.2316481


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