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dc.contributor.author
Bilovol, Vitaliy
dc.contributor.author
Pampillo, L. G.
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Saccone, Fabio Daniel
dc.date.available
2017-04-04T20:01:35Z
dc.date.issued
2014-05
dc.identifier.citation
Bilovol, Vitaliy; Pampillo, L. G.; Saccone, Fabio Daniel; Study on target-film structural correlation in thin cobalt ferrite films grown by Pulsed Laser Deposition technique; Elsevier Science; Thin Solid Films; 562; 5-2014; 218-222
dc.identifier.issn
0040-6090
dc.identifier.uri
http://hdl.handle.net/11336/14795
dc.description.abstract
We prepared three films of crystalline cobalt ferrite under identical deposition conditions (time, temperature, pressure) using three different targets consolidated from CoFe2O4 (CFO) crystalline nanoparticles (NPs). The NPs were previously prepared by a chemical route varying their synthesis conditions in order to promote different variations in the degree of structural distortions. The purpose of this work is to study how the degree of crystal distortion of the precursor material (target) influences the structural properties of the films when they are grown by pulsed laser deposition (PLD). 57Fe Mössbauer spectroscopy was used to study the local environment of iron atoms in the powders (targets for PLD). The Williamson–Hall plots were used to show the degree of the strain present in the films. X-ray absorption near edge structure spectra of the films, taken in grazing incidence geometry, were also carried out. The results explicitly demonstrate that the film with the largest strain was deposited using structurally more imperfect CFO powders whereas the film with the smallest strain was grown using the best powder from the structural point of view. These results were reinforced indirectly by magnetic measurements (exchange bias effect) in Fe/CFO bilayers (thin iron film was deposited additionally for this purpose) when hysteresis loops were analyzed after field cooling at a 3 T magnetic field. We show that the quality of thin cobalt ferrite films depends on the quality of the precursor material when the PLD technique is involved.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.subject
Cobalt Ferrite
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Thin Films
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Pulsed Laser Deposition
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Structural Properites
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X-Ray Absorption Near Edge Structure
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Nano-materiales
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Nanotecnología
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Study on target-film structural correlation in thin cobalt ferrite films grown by Pulsed Laser Deposition technique
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-04-03T17:30:06Z
dc.journal.volume
562
dc.journal.pagination
218-222
dc.journal.pais
Países Bajos
dc.journal.ciudad
Ámsterdam
dc.description.fil
Fil: Bilovol, Vitaliy. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
dc.description.fil
Fil: Pampillo, L. G.. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
dc.description.fil
Fil: Saccone, Fabio Daniel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
dc.journal.title
Thin Solid Films
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0040609014004805
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.tsf.2014.04.060
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