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dc.contributor.author
Morando, Carina Noemi
dc.contributor.author
Fornaro, Osvaldo
dc.date.available
2021-10-13T20:24:09Z
dc.date.issued
2021-01-08
dc.identifier.citation
Morando, Carina Noemi; Fornaro, Osvaldo; Influence of aging on microstructure and hardness of lead-free solder alloys; Emerald; Soldering & Surface Mount Technology; 33; 1; 8-1-2021; 57-64
dc.identifier.issn
0954-0911
dc.identifier.uri
http://hdl.handle.net/11336/143454
dc.description.abstract
Purpose: The purpose of this paper is to carry out a study of the evolution of the microstructure and the microhardness of Sn-Cu-Ag alloys from as-cast condition and under artificial isothermal aging at different temperatures (100ºC and 180ºC) for a treatment time up to 500 h. A comparison with Sn-37% Pb eutectic solder samples was also made. Design/methodology/approach: Sn-3.5%Ag, Sn-0.7%Cu and Sn-3.5%Ag-0.9%Cu were poured in two different cooling rate conditions and then aged at 100ºC (373ºK) and 180 °C (453ºK) during 500 h. Microstructural changes were observed by optical microscopy, scanning electron micrograph and energy dispersive X-ray microanalysis. Differential scanning calorimetry technique (DSC) was also used to confirm the obtained results. Findings: A decrease up to 20% in microhardness respect to the value of the as-cast alloy was observed for both aging temperatures. These changes can be explained considering the coarsening and recrystallization of Sn dendrites present in the microstructures of all the systems studied. Originality/value: There is no evidence of dissolution or precipitation of new phases in the range of studied temperatures that could be detected by DSC calorimetry technique. The acting mechanisms must be the result of coarsening of Sn dendrites and the residual stresses relaxation during the first stages of the isothermal aging.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Emerald
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
DIFFERENTIAL SCANNING CALORIMETRY (DSC)
dc.subject
EUTECTIC SOLDER ALLOYS
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LEAD FREE SOLDER ALLOYS
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MICROSTRUCTURAL AND MICROHARDNESS CHANGE
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MICROSTRUCTURE
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PB-FREE
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SN-AG-CU
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SN-BASED SOLDER ALLOYS
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SNAGCU (SAC) EUTECTIC ALLOYS
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SOLDER ALLOYS
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THERMAL PROPERTIES
dc.subject.classification
Otras Ingeniería de los Materiales
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Ingeniería de los Materiales
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Influence of aging on microstructure and hardness of lead-free solder alloys
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2021-02-10T21:05:16Z
dc.journal.volume
33
dc.journal.number
1
dc.journal.pagination
57-64
dc.journal.pais
Reino Unido
dc.description.fil
Fil: Morando, Carina Noemi. Universidad Nacional del Centro de la Provincia de Buenos Aires. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires. - Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tandil. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires. - Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires; Argentina
dc.description.fil
Fil: Fornaro, Osvaldo. Universidad Nacional del Centro de la Provincia de Buenos Aires. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires. - Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tandil. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires. - Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones en Física e Ingeniería del Centro de la Provincia de Buenos Aires; Argentina
dc.journal.title
Soldering & Surface Mount Technology
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.emerald.com/insight/content/doi/10.1108/SSMT-03-2020-0013/full/html
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1108/SSMT-03-2020-0013
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