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dc.contributor.author
Farigliano, Lucas Martín  
dc.contributor.author
Paredes Olivera, Patricia  
dc.contributor.author
Patrito, Eduardo Martin  
dc.date.available
2021-10-04T21:55:24Z  
dc.date.issued
2020-06  
dc.identifier.citation
Farigliano, Lucas Martín; Paredes Olivera, Patricia; Patrito, Eduardo Martin; Initial steps of oxidative etching of MoS 2 basal planeinduced by O 2; American Chemical Society; Journal of Physical Chemistry C; 124; 24; 6-2020; 13177-13186  
dc.identifier.issn
1932-7447  
dc.identifier.uri
http://hdl.handle.net/11336/142572  
dc.description.abstract
We have investigated the first stages of oxidation of the basal plane of MoS2 with O2. The different intermediates in the energy landscape were found at 0 K with nudged-elastic band calculations, and their reactivity was evaluated at higher temperatures by performing ab initio molecular dynamics simulations. We identified the intermediates and mechanisms leading to the desorption of both SO and SO2 species. The key intermediate consists of an O atom bound on top of an S atom with a second O atom inserted into the S-Mo bond, giving rise to a stable O=S-O-Mo moiety. The mechanisms leading to this intermediate upon adsorption of O2 on the basal plane of MoS2 are discussed. From the O=S-O-Mo intermediate, SO2 may desorb directly generating a single sulfur vacancy on the surface while its decomposition leads to the desorption of SO and leaves substitutional oxygen on the surface. These etching mechanisms were also observed in the ab initio molecular dynamics simulations, in good agreement with energy profiles calculated along the reaction paths. Diffusion of O atoms on top of the sulfur layer and direct desorption of SO groups were never observed in the molecular dynamics simulations because these processes have high energy barriers (2.4 and 3.1 eV, respectively). However, subsurface diffusion of O atoms, involving the formation of both O-S and O-Mo bonds, is a competing process with lower energy barriers.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Chemical Society  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Desorption  
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Diffusion  
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Oxygen  
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Chemical reactions  
dc.subject.classification
Físico-Química, Ciencia de los Polímeros, Electroquímica  
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Ciencias Químicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Initial steps of oxidative etching of MoS 2 basal planeinduced by O 2  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2021-09-06T16:45:26Z  
dc.identifier.eissn
1932-7455  
dc.journal.volume
124  
dc.journal.number
24  
dc.journal.pagination
13177-13186  
dc.journal.pais
Estados Unidos  
dc.description.fil
Fil: Farigliano, Lucas Martín. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina  
dc.description.fil
Fil: Paredes Olivera, Patricia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina  
dc.description.fil
Fil: Patrito, Eduardo Martin. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina  
dc.journal.title
Journal of Physical Chemistry C  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://pubs.acs.org/doi/10.1021/acs.jpcc.0c02141  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1021/acs.jpcc.0c02141