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Artículo

Protocol for automating error removal from yield maps

Vega, Andrés Martín; Córdoba, MarianoIcon ; Castro Franco, MauricioIcon ; Balzarini, Monica GracielaIcon
Fecha de publicación: 10/2019
Editorial: Springer
Revista: Precision Agriculture
ISSN: 1385-2256
e-ISSN: 1573-1618
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Otras Ciencias Agrícolas

Resumen

Yield mapping is one of the most widely used precision farming technologies. However, the value of the maps can be compromised by the presence of systematic and random errors in raw within field data. In this paper, an automated method to clean yield maps is proposed so as to ensure the quality of further data processing and management decisions. First, data were screened by filtering null and edge yield values as well global outliers. Second, spatial outliers or local defective observations were deleted. The local Moran’s index of spatial autocorrelation and Moran’s plot were used as tool to identify the spatial outliers. The protocol to filter out global and local outliers was evaluated on 595 real yield datasets from different grain crops. Significant improvements in the distribution and spatial structure of yield datasets was found. Approximately 30% of the dataset size was removed from each monitor dataset, with one third of the removal occurring during filtering of spatial outliers. The automation of null, edge yield values and the removal of global outliers improved yield distributions, whereas the cleaning of local outliers impacted the yield spatial structure for all yield maps and crops. The algorithm proposed to clean yield maps is easy to apply for preprocessing the growing number of available yield maps.
Palabras clave: GLOBAL OUTLIERS , LOCAL OUTLIERS , SPATIAL DATA MINING
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info:eu-repo/semantics/restrictedAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/126738
DOI: https://doi.org/10.1007/s11119-018-09632-8
URL: https://link.springer.com/article/10.1007%2Fs11119-018-09632-8
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Articulos (UFYMA)
Articulos de UNIDAD DE FITOPATOLOGIA Y MODELIZACION AGRICOLA
Citación
Vega, Andrés Martín; Córdoba, Mariano; Castro Franco, Mauricio; Balzarini, Monica Graciela; Protocol for automating error removal from yield maps; Springer; Precision Agriculture; 20; 5; 10-2019; 1030-1044
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