A compact high-resolution spectrometer based on a segmented conical crystal analyzer

Abstract

In this work, the design, fabrication, and evaluation of a compact, one-shot spectrometer based on a segmented conically bent crystal analyzer are described. The system is a “one-shot” wavelength dispersive spectrometer, which has a crystal analyzer with an innovative geometry. It reaches an energy resolution of around 8 eV for Mn Kα1 line, which is at least an order of magnitude better than the commonly used energy dispersive spectrometers for fluorescence, and is comparable to current wavelength dispersive spectrometers. The prototype spectrometer fabricated in this work avoids angle scans that most wavelength dispersive spectrometers require, has the advantage of a sample–detector distance of only 146 mm, and allows for the simultaneous measurement of approximately a 2 keV window. This system is suitable to be used at synchrotron radiation facilities and free electron lasers, and it can even be adapted to an x-ray tube in any conventional x-ray laboratory.