X-ray micrographic imaging system based on COTS CMOS sensors

This paper presents the use of commercial off the shelf CMOS image sensors for the acquisition of X-ray images with high spatial resolution. The X-ray images, with application in biology, electronic components inspection, and paleontology research, are obtained with 8-keV photons from a Cu tube. The quantum efficiency of the detector is estimated using attenuation lengths of photons in the sensor and compared to traditional scintillator conversion layers. The spatial resolution observed with the sensor is limited by the charge redistribution produced after photon interaction with Si.

Palabras clave: CMOS , CMOS IMAGE SENSORS , RADIATION MEASUREMENT , VLSI , X-RAY APPLICATIONS

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Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)

Identificadores

URI: http://hdl.handle.net/11336/125601

DOI: https://doi.org/10.1002/cta.2502

URL: https://onlinelibrary.wiley.com/doi/full/10.1002/cta.2502

Colecciones

Articulos(CCT - PATAGONIA NORTE)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE

Citación

Alcalde Bessia, Fabricio Pablo; Pérez, Martin; Lipovetzky, José; Piunno, Natalia Alejandra; Mateos, Horacio; et al.; X-ray micrographic imaging system based on COTS CMOS sensors; John Wiley & Sons Ltd; International Journal Of Circuit Theory And Applications; 46; 10; 4-6-2018; 1848-1857

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