Artículo

Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

Sanjuan, Federico EzequielIcon ; Bockelt, Alexander; Vidal, Borja
Fecha de publicación: 08/2014
Editorial: Optical Society Of America
Revista: Applied Optics
ISSN: 1559-128X
e-ISSN: 2155-3165
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
Palabras clave: Optical Properties , Spectroscopy , Interference , Terahertz
 
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/11863
DOI: https://doi.org/10.1364/AO.53.004910
URL: https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910
Colecciones
Articulos(CIOP)
Articulos de CENTRO DE INVEST.OPTICAS (I)
Citación
Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913
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