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dc.contributor.author
Sanjuan, Federico Ezequiel  
dc.contributor.author
Vidal, B.  
dc.date.available
2017-01-24T19:38:34Z  
dc.date.issued
2014-02  
dc.identifier.citation
Sanjuan, Federico Ezequiel; Vidal, B.; Refractive index calculation from echo interference in pulsed terahertz spectroscopy; Inst Engineering Technology-iet; Electronics Letters; 50; 4; 2-2014; 308-309  
dc.identifier.issn
0013-5194  
dc.identifier.uri
http://hdl.handle.net/11336/11848  
dc.description.abstract
A method for calculating the average refractive index of a sample using transmission terahertz time-domain spectroscopy in a single measurement is presented. The refractive index is derived from the analysis of the frequency-domain interference caused by Fabry-Pérot reflections in the sample through the discrete Fourier transform of the spectrum module. This approach is simple and fast (not requiring a reference measurement), improves sensitivity over direct time-domain analysis and allows the derivation of the refractive index in a specific frequency window. The method can also be used to identify unwanted reflections in the experimental setup.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Inst Engineering Technology-iet  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/  
dc.subject
Fabry-Perot Interferometers  
dc.subject
Discrete Fourier Transforms  
dc.subject
Refractive Index Measurement  
dc.subject
Terahertz Spectroscopy  
dc.subject.classification
Otras Ingenierías y Tecnologías  
dc.subject.classification
Otras Ingenierías y Tecnologías  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Refractive index calculation from echo interference in pulsed terahertz spectroscopy  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-01-24T14:41:59Z  
dc.journal.volume
50  
dc.journal.number
4  
dc.journal.pagination
308-309  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Sanjuan, Federico Ezequiel. Universidad Politecnica de Valencia; España. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Vidal, B.. Universidad Politecnica de Valencia; España  
dc.journal.title
Electronics Letters  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1049/el.2013.3937  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/6746299/?arnumber=6746299