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dc.contributor.author
Zaldivar Escola, Facundo
dc.contributor.author
Mingolo, Nélida
dc.contributor.author
Martínez, Oscar E.
dc.contributor.author
Rocca, Jorge J.
dc.contributor.author
Menoni, Carmen S.
dc.date.available
2020-11-11T19:14:43Z
dc.date.issued
2019-02
dc.identifier.citation
Zaldivar Escola, Facundo; Mingolo, Nélida; Martínez, Oscar E.; Rocca, Jorge J.; Menoni, Carmen S.; Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy; Optical Society of America; Optics Express; 27; 4; 2-2019; 5729-5744
dc.identifier.issn
1094-4087
dc.identifier.uri
http://hdl.handle.net/11336/118189
dc.description.abstract
We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Optical Society of America
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
laser annealing mechanisms
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photothermal microscopy
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thin film coatings
dc.subject.classification
Recubrimientos y Películas
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Ingeniería de los Materiales
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2020-11-11T12:30:33Z
dc.journal.volume
27
dc.journal.number
4
dc.journal.pagination
5729-5744
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Zaldivar Escola, Facundo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Mingolo, Nélida. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
dc.description.fil
Fil: Martínez, Oscar E.. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
dc.description.fil
Fil: Rocca, Jorge J.. State University of Colorado - Fort Collins; Estados Unidos
dc.description.fil
Fil: Menoni, Carmen S.. State University of Colorado - Fort Collins; Estados Unidos
dc.journal.title
Optics Express
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-4-5729&id=405099
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1364/OE.27.005729
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