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dc.contributor.author
Cossutta, H.  
dc.contributor.author
Taretto, Kurt Rodolfo  
dc.contributor.author
Troviano, Mauricio Eduardo  
dc.date.available
2017-01-18T19:53:49Z  
dc.date.issued
2014-10  
dc.identifier.citation
Cossutta, H. ; Taretto, Kurt Rodolfo; Troviano, Mauricio Eduardo; Low-cost system for micrometer-resolution solar cell characterization by light beam-induced current mapping; IOP Publishing; Measurement Science & Technology (print); 25; 10; 10-2014; 105801-105808  
dc.identifier.issn
0957-0233  
dc.identifier.uri
http://hdl.handle.net/11336/11582  
dc.description.abstract
Light-beam induced current (LBIC) mapping is an increasingly utilized characterization technique for laboratory-scale as well as industrial-scale solar cells, which measures the local solar cell photocurrent by point illumination. This contribution demonstrates the design and testing of an LBIC mapping device capable of measuring LBIC maps of solar cells using inexpensive materials. With a spatial resolution of 4 μm and an auto-focused beam spot size of about 2 μm, obtained from a standard CD/DVD pickup, high-resolution LBIC maps of thin-film solar cells are obtained. The system was demonstrated by measuring LBIC maps on thin-film solar cells, revealing significant, micrometer-sized photocurrent heterogeneities that are otherwise unseen when using typical commercial LBIC systems with lower resolution.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Solar Cell  
dc.subject
Pphotocurrent Mapping  
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Light Beam-Induced Current  
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Lbic  
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Laser Pickup  
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S-Curve  
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Cd-Dvd  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Low-cost system for micrometer-resolution solar cell characterization by light beam-induced current mapping  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-01-17T19:14:28Z  
dc.journal.volume
25  
dc.journal.number
10  
dc.journal.pagination
105801-105808  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Cossutta, H. . Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina  
dc.description.fil
Fil: Taretto, Kurt Rodolfo. Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Patagonia Norte. Instituto de Investigación y Desarrollo en Ingeniería de Procesos, Biotecnología y Energías Alternativas; Argentina  
dc.description.fil
Fil: Troviano, Mauricio Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Patagonia Norte. Instituto de Investigación y Desarrollo En Ingeniería de Procesos, Biotecnología y Energías Alternativas; Argentina. Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina  
dc.journal.title
Measurement Science & Technology (print)  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/0957-0233/25/10/105801/meta  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/0957-0233/25/10/105801