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dc.contributor.author
Cossutta, H.
dc.contributor.author
Taretto, Kurt Rodolfo
dc.contributor.author
Troviano, Mauricio Eduardo
dc.date.available
2017-01-18T19:53:49Z
dc.date.issued
2014-10
dc.identifier.citation
Cossutta, H. ; Taretto, Kurt Rodolfo; Troviano, Mauricio Eduardo; Low-cost system for micrometer-resolution solar cell characterization by light beam-induced current mapping; IOP Publishing; Measurement Science & Technology (print); 25; 10; 10-2014; 105801-105808
dc.identifier.issn
0957-0233
dc.identifier.uri
http://hdl.handle.net/11336/11582
dc.description.abstract
Light-beam induced current (LBIC) mapping is an increasingly utilized characterization technique for laboratory-scale as well as industrial-scale solar cells, which measures the local solar cell photocurrent by point illumination. This contribution demonstrates the design and testing of an LBIC mapping device capable of measuring LBIC maps of solar cells using inexpensive materials. With a spatial resolution of 4 μm and an auto-focused beam spot size of about 2 μm, obtained from a standard CD/DVD pickup, high-resolution LBIC maps of thin-film solar cells are obtained. The system was demonstrated by measuring LBIC maps on thin-film solar cells, revealing significant, micrometer-sized photocurrent heterogeneities that are otherwise unseen when using typical commercial LBIC systems with lower resolution.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
IOP Publishing
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Solar Cell
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Pphotocurrent Mapping
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Light Beam-Induced Current
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Lbic
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Laser Pickup
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S-Curve
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Cd-Dvd
dc.subject.classification
Ingeniería Eléctrica y Electrónica
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Low-cost system for micrometer-resolution solar cell characterization by light beam-induced current mapping
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-01-17T19:14:28Z
dc.journal.volume
25
dc.journal.number
10
dc.journal.pagination
105801-105808
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Cossutta, H. . Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina
dc.description.fil
Fil: Taretto, Kurt Rodolfo. Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Patagonia Norte. Instituto de Investigación y Desarrollo en Ingeniería de Procesos, Biotecnología y Energías Alternativas; Argentina
dc.description.fil
Fil: Troviano, Mauricio Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Patagonia Norte. Instituto de Investigación y Desarrollo En Ingeniería de Procesos, Biotecnología y Energías Alternativas; Argentina. Universidad Nacional del Comahue. Facultad de Ingenieria. Departamento de Electrotecnica; Argentina
dc.journal.title
Measurement Science & Technology (print)
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/0957-0233/25/10/105801/meta
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/0957-0233/25/10/105801
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