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dc.contributor.author
Hettich, Mike
dc.contributor.author
Jacob, Karl
dc.contributor.author
Ristow, Oliver
dc.contributor.author
He, Chuan
dc.contributor.author
Mayer, Jan
dc.contributor.author
Schubert, Martin
dc.contributor.author
Gusev, Vitalyi
dc.contributor.author
Bruchhausen, Axel Emerico
dc.contributor.author
Dekorsy, Thomas
dc.date.available
2017-01-13T19:08:10Z
dc.date.issued
2012-11
dc.identifier.citation
Hettich, Mike ; Jacob, Karl ; Ristow, Oliver ; He, Chuan ; Mayer, Jan ; et al.; Imaging of a patterned and buried molecular layer by coherent acoustic phonon spectroscopy; American Institute Of Physics; Applied Physics Letters; 101; 19; 11-2012; 191606-191606
dc.identifier.issn
0003-6951
dc.identifier.uri
http://hdl.handle.net/11336/11326
dc.description.abstract
A molecular layer of aminopropyltriethoxysilane is patterned with a focused ion beam and subsequently covered by a gold film. The gold-polymer-substrate structures are afterwards imaged by ultrafast coherent acoustic phonon spectroscopy in reflection geometry. We demonstrate that the lateral structure of the covered polymer layer can be detected via the damping time of the vibrational mode of the gold film. Furthermore, we utilize Brillouin oscillations originating from the silicon substrate to map the structures and to estimate the molecular layer thickness.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
American Institute Of Physics
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Brillouin Spectra
dc.subject
Focused Ion Beam Technology
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High-Speed Optical Techniques
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Organic Compounds
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Phonon Spectra
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Vibrational Modes
dc.subject.classification
Óptica
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Imaging of a patterned and buried molecular layer by coherent acoustic phonon spectroscopy
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-01-06T20:02:05Z
dc.journal.volume
101
dc.journal.number
19
dc.journal.pagination
191606-191606
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Hettich, Mike . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: Jacob, Karl . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: Ristow, Oliver . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: He, Chuan . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: Mayer, Jan . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: Schubert, Martin . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.description.fil
Fil: Gusev, Vitalyi . Centre National de la Recherche Scientifique; Francia
dc.description.fil
Fil: Bruchhausen, Axel Emerico. University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Area de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Comisión Nacional de Energía Atómica. Gerencia del Area de Energía Nuclear. Instituto Balseiro; Argentina
dc.description.fil
Fil: Dekorsy, Thomas . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania
dc.journal.title
Applied Physics Letters
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4767141
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4767141
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