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dc.contributor.author
Hettich, Mike  
dc.contributor.author
Jacob, Karl  
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Ristow, Oliver  
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He, Chuan  
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Mayer, Jan  
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Schubert, Martin  
dc.contributor.author
Gusev, Vitalyi  
dc.contributor.author
Bruchhausen, Axel Emerico  
dc.contributor.author
Dekorsy, Thomas  
dc.date.available
2017-01-13T19:08:10Z  
dc.date.issued
2012-11  
dc.identifier.citation
Hettich, Mike ; Jacob, Karl ; Ristow, Oliver ; He, Chuan ; Mayer, Jan ; et al.; Imaging of a patterned and buried molecular layer by coherent acoustic phonon spectroscopy; American Institute Of Physics; Applied Physics Letters; 101; 19; 11-2012; 191606-191606  
dc.identifier.issn
0003-6951  
dc.identifier.uri
http://hdl.handle.net/11336/11326  
dc.description.abstract
A molecular layer of aminopropyltriethoxysilane is patterned with a focused ion beam and subsequently covered by a gold film. The gold-polymer-substrate structures are afterwards imaged by ultrafast coherent acoustic phonon spectroscopy in reflection geometry. We demonstrate that the lateral structure of the covered polymer layer can be detected via the damping time of the vibrational mode of the gold film. Furthermore, we utilize Brillouin oscillations originating from the silicon substrate to map the structures and to estimate the molecular layer thickness.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute Of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Brillouin Spectra  
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Focused Ion Beam Technology  
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High-Speed Optical Techniques  
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Organic Compounds  
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Phonon Spectra  
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Vibrational Modes  
dc.subject.classification
Óptica  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Imaging of a patterned and buried molecular layer by coherent acoustic phonon spectroscopy  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-01-06T20:02:05Z  
dc.journal.volume
101  
dc.journal.number
19  
dc.journal.pagination
191606-191606  
dc.journal.pais
Estados Unidos  
dc.description.fil
Fil: Hettich, Mike . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: Jacob, Karl . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: Ristow, Oliver . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: He, Chuan . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: Mayer, Jan . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: Schubert, Martin . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.description.fil
Fil: Gusev, Vitalyi . Centre National de la Recherche Scientifique; Francia  
dc.description.fil
Fil: Bruchhausen, Axel Emerico. University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Area de Investigación y Aplicaciones No Nucleares. Gerencia de Física (Centro Atómico Bariloche); Argentina. Comisión Nacional de Energía Atómica. Gerencia del Area de Energía Nuclear. Instituto Balseiro; Argentina  
dc.description.fil
Fil: Dekorsy, Thomas . University of Konstanz. Department of Physics and Center for Applied Photonics; Alemania  
dc.journal.title
Applied Physics Letters  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4767141  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4767141