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dc.contributor.author
Zhang, Haolin  
dc.contributor.author
Monroy Ramírez, Freddy A.  
dc.contributor.author
Lizana, Ángel  
dc.contributor.author
Iemmi, Claudio César  
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Bennis, Noureddine  
dc.contributor.author
Morawiak, Przemysław  
dc.contributor.author
Piecek, Wiktor  
dc.contributor.author
Campos, Juan  
dc.date.available
2020-09-03T20:42:54Z  
dc.date.issued
2019-02  
dc.identifier.citation
Zhang, Haolin; Monroy Ramírez, Freddy A.; Lizana, Ángel; Iemmi, Claudio César; Bennis, Noureddine; et al.; Wavefront imaging by using an inline holographic microscopy system based on a double-sideband filter; Elsevier; Optics And Lasers In Engineering; 113; 2-2019; 71-76  
dc.identifier.issn
0143-8166  
dc.identifier.uri
http://hdl.handle.net/11336/113185  
dc.description.abstract
In this letter, we propose an inline holographic microscopy (ILHM) system, based on the double-sideband technique (DST), for wavefront imaging. The presented optical system shows all the benefits of the previously reported DST (instantaneous removing of ghost images in an inline scheme) but adapted to a microscopic system. The double-sideband filter is implemented by using a transparent liquid crystal (LC) bi-pixel device. Specifically, by addressing the proper phase values to each half of the LC bi-panel, which is located at the Fourier plane of the holographic system, the conjugate image is removed. What is more, by using a high numerical aperture microscope objective, we achieved the microscopic wavefront holography imaging. Finally, the feasibility of the proposed system is testified by obtaining holographic wavefront images of different objects.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier  
dc.rights
info:eu-repo/semantics/restrictedAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
FOURIER OPTICS  
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HOLOGRAPHY  
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LIQUID CRYSTALS  
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MICROSCOPY  
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WAVEFRONT SENSING  
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Óptica  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Wavefront imaging by using an inline holographic microscopy system based on a double-sideband filter  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2020-07-08T18:42:26Z  
dc.journal.volume
113  
dc.journal.pagination
71-76  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Amsterdam  
dc.description.fil
Fil: Zhang, Haolin. Universidad Autonoma de Barcelona. Facultad de Física; España  
dc.description.fil
Fil: Monroy Ramírez, Freddy A.. Universidad Nacional de Colombia; Colombia  
dc.description.fil
Fil: Lizana, Ángel. Universidad Autonoma de Barcelona. Facultad de Física; España  
dc.description.fil
Fil: Iemmi, Claudio César. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria; Argentina  
dc.description.fil
Fil: Bennis, Noureddine. Military University Of Technology; Polonia  
dc.description.fil
Fil: Morawiak, Przemysław. Military University Of Technology; Polonia  
dc.description.fil
Fil: Piecek, Wiktor. Military University Of Technology; Polonia  
dc.description.fil
Fil: Campos, Juan. Universidad Autonoma de Barcelona. Facultad de Física; España  
dc.journal.title
Optics And Lasers In Engineering  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://linkinghub.elsevier.com/retrieve/pii/S0143816618309400  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.optlaseng.2018.10.003