Artículo
Recrystallization and martensitic transformation in nanometric grain size Cu-Al-Ni thin films grown by DC sputtering at room temperature
Fecha de publicación:
05/2018
Editorial:
Elsevier Science Inc
Revista:
Materials Characterization
ISSN:
1044-5803
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We report the recrystallization of metastable hexagonal and body centered cubic BCC phase in free-standing 6 μm thick Cu-Al-Ni films grown by DC sputtering at room temperature. The results show that the BCC phase recrystallizes to L2_1 at around 533 K together with precipitation of γ2-phase. Annealing temperatures (533 K-623 K) at short times (0-30 min) produce systematic increment of the fraction of γ2-phase. Films with phase coexistence of hexagonal, γ2 and L2_1 structure display temperature driven martensitic transformation. This transformation is observed for samples with austenite grain size of around 30 nm. In all cases, the martensitic transformation temperature (MS) notoriously decreases (compared to bulk) and systematically increases with the annealing temperatures and annealing time. In addition, the films display extended transformation and retransformation ranges along with asymmetric hysteresis, which may be associated to restitutive forces due to elastic deformations at martensite - martensite and martensite - austenite interfaces. Annealing temperatures above 623 K produce fast precipitation to equilibrium α- and γ2-phases. The austenitic phase can be recovered after annealing over 1000 K and fast quenching in ice-water.
Palabras clave:
MICROSTRUCTURE
,
SHAPE MEMORY
,
THIN FILMS
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Identificadores
Colecciones
Articulos(CCT - PATAGONIA NORTE)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Citación
Morán, Mauricio Javier; Condó, Sergio Alberto; Haberkorn, Nestor Fabian; Recrystallization and martensitic transformation in nanometric grain size Cu-Al-Ni thin films grown by DC sputtering at room temperature
; Elsevier Science Inc; Materials Characterization; 139; 5-2018; 446-451
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