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dc.contributor.author
Sturiale, Alejandro Ernesto  
dc.contributor.author
Li, H.  
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Rath, J.  
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Schropp, R.  
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Rubinelli, Francisco Alberto  
dc.date.available
2017-05-30T14:14:32Z  
dc.date.issued
2009-05-02  
dc.identifier.citation
Sturiale, Alejandro Ernesto; Li, H.; Rath, J.; Schropp, R.; Rubinelli, Francisco Alberto; Dark Current Voltage Characteristics of Micromorph Silicon Tandem Cells; American Institute Of Physics; Journal Of Applied Physics; 106; 1; 2-5-2009; 1-10; 14502  
dc.identifier.issn
0021-8979  
dc.identifier.uri
http://hdl.handle.net/11336/17097  
dc.description.abstract
The transport mechanisms controlling the forward dark current-voltage characteristic of the silicon micromorph tandem solar cell were investigated with numerical modeling techniques. The dark current-voltage characteristics of the micromorph tandem structure at forward voltages show three regions: two with an exponential dependence and a third where the current grows more slowly with the applied voltage. In the first exponential region the current is entirely controlled by recombination through gap states of the top cell. In the second exponential region the current is controlled by the mixture of recombination through gap states of both the top and bottom cells and by free carrier diffusion along the a-Si:H intrinsic layer. In the third region the onset of the electron space charge limited current on the a-Si:H top cell can be observed along with some other mechanisms that are discussed in the paper. The high forward dark J-V curve of the tandem cell can be used as diagnosis tool to quickly inspect the efficiency of the recombination junction in recombining the electron-hole pairs generated under illumination in the top and bottom cells. The dark current at high forward voltages is highly influenced by the amount of electron-hole pairs thermally generated inside the recombination junction.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute Of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Tandem Micromorph Solar Cells  
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Dark Current Voltage Characteristics  
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Amorphous Silicon  
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Microcrystalline Silicon  
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Ingeniería Eléctrica y Electrónica  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Dark Current Voltage Characteristics of Micromorph Silicon Tandem Cells  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-05-22T14:04:11Z  
dc.journal.volume
106  
dc.journal.number
1  
dc.journal.pagination
1-10; 14502  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Melville  
dc.description.fil
Fil: Sturiale, Alejandro Ernesto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina  
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Fil: Li, H.. Utrecht University; Países Bajos  
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Fil: Rath, J.. Utrecht University; Países Bajos  
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Fil: Schropp, R.. Utrecht University; Países Bajos  
dc.description.fil
Fil: Rubinelli, Francisco Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina  
dc.journal.title
Journal Of Applied Physics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.3151691  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.3151691